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基于散射测量的光学元件表面质量评估方法研究 学位论文
工学博士, 中国科学院光电技术研究所: 中国科学院大学, 2019
Authors:  张科鹏
Adobe PDF(4472Kb)  |  Favorite  |  View/Download:51/0  |  Submit date:2019/06/16
光学元件+光学薄膜+光散射  
Application of first-order nonparaxial scalar theory to determine surface scattering intensity of multilayer optical coatings 期刊论文
OPTICS EXPRESS, 2018, 卷号: 26, 期号: 26, 页码: 34592-34608
Authors:  Zhang, Kepeng;  Huang, Wei;  Zhang, Bin;  Tian, Xiaoxi;  Zhang, Yinhua;  Guan, Chunlin
Adobe PDF(3085Kb)  |  Favorite  |  View/Download:47/1  |  Submit date:2019/08/23
Multilayers  Optical coatings  Optical multilayers  Surface scattering  
First-order nonparaxial scalar theory of surface and bulk scattering for high-quality optical coatings 期刊论文
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2018, 卷号: 35, 期号: 11, 页码: 1823-1831
Authors:  Zhang, Kepeng;  Huang, Renshuai;  Tian, Xiaoxi;  Zhang, Yinhua;  Huang, Wei;  Guan, Chunlin
Adobe PDF(3643Kb)  |  Favorite  |  View/Download:33/0  |  Submit date:2019/08/23
Multilayers  Optical coatings  
Determination of refractive index and thickness of YbF3 thin films deposited at different bias voltages of APS ion source from spectrophotometric methods 期刊论文
ADVANCED OPTICAL TECHNOLOGIES, 2018, 卷号: 7, 期号: 1-2, 页码: 33-37
Authors:  Zhang, Yinhua;  Xiong, Shengming;  Huang, Wei;  Zhang, Kepeng
Adobe PDF(409Kb)  |  Favorite  |  View/Download:34/0  |  Submit date:2019/08/23
Bias Voltage  Refractive Index  Transmittance Spectra  Ybf3 Thin Film  
Determination of infrared refractive index of ZnS and YbF3 thin films by spectroscopy 期刊论文
OPTIK, 2018, 卷号: 170, 页码: 321-327
Authors:  Zhang, Yinhua;  Zhang, Kepeng;  Huang, Wei;  Xiong, Shengming
Adobe PDF(838Kb)  |  Favorite  |  View/Download:33/0  |  Submit date:2019/08/23
YbF3 thin film  ZnS thin film  Refractive index  Transmittance spectra  
Characterization of surface defects of silicon substrates by the total scattering and absorption 会议论文
0277-786X
Authors:  Zhang, Kepeng;  Zhang, Xingxin;  Huang, Wei
Adobe PDF(461Kb)  |  Favorite  |  View/Download:47/0  |  Submit date:2018/12/20
Absorption - Atomic force microscopy - Brillouin scattering - Light scattering - Microscopes - Optical systems - Photonics - Reflection - Silicon - Substrates - Surface roughness - Surface scattering