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Analysis of spurious diffraction orders of computer-generated hologram in symmetric aspheric metrology 期刊论文
Optics Express, 2017, 卷号: 25, 期号: 17, 页码: 20556-20572
Authors:  He, Yiwei;  Hou, Xi;  Wu, Fan;  Ma, Xinxue;  Liang, Rongguang
Adobe PDF(4237Kb)  |  Favorite  |  View/Download:112/0  |  Submit date:2018/11/20
Aspherics - Diffraction - Electron holography - Holograms - Imaging systems - Units of measurement  
Dimensional metrology of smooth micro structures utilizing the spatial modulation of white-light interference fringes 期刊论文
Optics and Laser Technology, 2017, 卷号: 93, 页码: 187-193
Authors:  Zhou, Yi;  Tang, Yan;  Deng, Qinyuan;  Liu, Junbo;  Wang, Jian;  Zhao, Lixin
Adobe PDF(2592Kb)  |  Favorite  |  View/Download:69/0  |  Submit date:2018/11/20
Frequency domain analysis - Interferometry - Microstructure - Phase measurement - System stability - Topography - Units of measurement  
Dynamic metrology and data processing for precision freeform optics fabrication and testing 会议论文
0277-786X
Authors:  Aftab, Maham;  Trumper, Isaac;  Huang, Lei;  Choi, Heejoo;  Zhao, Wenchuan;  Graves, Logan;  Oh, Chang Jin;  Kim, Dae Wook
Adobe PDF(614Kb)  |  Favorite  |  View/Download:94/0  |  Submit date:2018/12/20
Adaptive optics - Data processing - Gradient methods - Manufacture - Measurements - Optical systems - Optical testing - Stochastic systems - Units of measurement  
Dimensional metrology of micro structure based on modulation depth in scanning broadband light interferometry 会议论文
0277-786X
Authors:  Zhou, Yi;  Tang, Yan;  Deng, Qinyuan;  Zhao, Lixin;  Hu, Song
Adobe PDF(606Kb)  |  Favorite  |  View/Download:75/0  |  Submit date:2018/12/20
Microstructure - Modulation - Surface topography - Units of measurement  
GPU-accelerated phase extraction algorithm for interferograms: A real-time application 期刊论文
Proceedings of SPIE: Optical Metrology and Inspection for Industrial Applications IV, 2016, 卷号: 10023, 页码: 1002327
Authors:  Zhu, Xiaoqiang;  Wu, Yongqian;  Liu, Fengwei
Adobe PDF(1027Kb)  |  Favorite  |  View/Download:72/0  |  Submit date:2018/06/14
Extraction  Interferometry  Matlab  Parallel Processing Systems  Phase Shift  Smart Cards  Units Of Measurement  
A method on error analysis for large-aperture optical telescope control system 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2016, 卷号: 9682, 页码: 96820C
Authors:  Su, Yanrui;  Wang, Qiang;  Yan, Fabao;  Liu, Xiang;  Huang, Yongmei
Adobe PDF(548Kb)  |  Favorite  |  View/Download:70/0  |  Submit date:2018/06/14
Control Systems  Error Analysis  Errors  Feedback  Frequency Domain Analysis  Jitter  Manufacture  Metal Drawing  Mirrors  Optical Telescopes  Optical Testing  Speed  Units Of Measurement