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Effects of immersion depth on super-resolution properties of index-different microsphere-assisted nanoimaging 期刊论文
APPLIED PHYSICS EXPRESS, 2018, 卷号: 11, 期号: 3, 页码: 32501
Authors:  Zhou, Yi;  Tang, Yan;  He, Yu;  Liu, Xi;  Hu, Song
Adobe PDF(1200Kb)  |  Favorite  |  View/Download：51/1  |  Submit date：2019/08/23
Optical resolving power  
Spatial Modulation-Assisted Scanning White-Light Interferometry for Noise Suppression 期刊论文
IEEE PHOTONICS TECHNOLOGY LETTERS, 2018, 卷号: 30, 期号: 4, 页码: 379-382
Authors:  Deng, Qinyuan;  Liu, Junbo;  Tang, Yan;  Zhou, Yi;  Yang, Yong;  Li, Jinlong;  Hu, Song
Adobe PDF(1383Kb)  |  Favorite  |  View/Download：62/0  |  Submit date：2019/08/23
Surface measurement  noise suppression  spatial modulation  
Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopy 期刊论文
OPTICS EXPRESS, 2018, 卷号: 26, 期号: 3, 页码: 2944-2953
Authors:  Xie, Zhongye;  Tang, Yan;  Zhou, Yi;  Deng, Qinyuan
Adobe PDF(3694Kb)  |  Favorite  |  View/Download：41/1  |  Submit date：2019/08/23
Digital devices  Film thickness  Interferometry  Modulation  Thickness measurement  
基于白光干涉频域分析的高精度表面形貌测量 期刊论文
中国激光, 2018, 卷号: 45, 期号: 6, 页码: 604001-604007
Authors:  邓钦元;  唐燕;  周毅;  杨勇;  胡松
Adobe PDF(8232Kb)  |  Favorite  |  View/Download：38/0  |  Submit date：2019/08/23
测量  空间频域  白光干涉  2π模糊  相干信息  相位突变  
Fast thickness measurement of thin films using two-dimensional Fourier transform-based structured illumination microscopy 会议论文
Proceedings of SPIE - 9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES (AOMATT 2018): META-SURFACE-WAVE AND PLANAR OPTICS, Chengdu, PEOPLES R CHINAChengdu, PEOPLES R CHINA, JUN 26-29, 2018JUN 26-29, 2018
Authors:  Xie, Zhongye;  Tang, Yan;  Liu, Xi;  Yang, Kejun;  Hu, Song
Adobe PDF(1425Kb)  |  Favorite  |  View/Download：30/0  |  Submit date：2019/08/23
thin films  Fourier transform  microscopy  surface topography  digital micro-mirror devices  modulation  
Efficient Super-Resolution Imaging Method for Micro-Nano Structure Based On Structured Illumination Modulation 会议论文
Proceedings of SPIE - 9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES (AOMATT 2018): META-SURFACE-WAVE AND PLANAR OPTICS, Chengdu, PEOPLES R CHINAChengdu, PEOPLES R CHINA, JUN 26-29, 2018JUN 26-29, 2018
Authors:  Yang Kejun;  Tang Yan;  Hu Song;  Chen Chuyi
Adobe PDF(516Kb)  |  Favorite  |  View/Download：32/0  |  Submit date：2019/08/23
Super-resolution imaging  image reconstruction  structured illumination  optical measurement  micro-nano structure  phase shifting  
Investigation of Microsphere-assisted Super-resolution Imaging 会议论文
Proceedings of SPIE - 9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES (AOMATT 2018): META-SURFACE-WAVE AND PLANAR OPTICS, Chengdu, PEOPLES R CHINAChengdu, PEOPLES R CHINA, JUN 26-29, 2018JUN 26-29, 2018
Authors:  Liu, Xi;  Tang, Yan;  Zhou, Yi;  Hu, Song
Adobe PDF(651Kb)  |  Favorite  |  View/Download：37/0  |  Submit date：2019/08/23
Microsphere  Optical microscope  Photonic nanojets  Super-resolution  
Characterization of micro structure through hybrid interference and phase determination in broadband light interferometry 期刊论文
Applied Optics, 2017, 卷号: 56, 期号: 8, 页码: 2301-2306
Authors:  Zhou, Yi;  Tang, Yan;  Zhu, Jiangping;  Deng, Qinyuan;  Yang, Yong;  Zhao, Lixin;  Hu, Song
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Microstructure  
Contrast enhancement of microsphere-assisted super-resolution imaging in dark-field microscopy 期刊论文
APPLIED PHYSICS EXPRESS, 2017, 卷号: 10, 期号: 8
Authors:  Zhou, Yi;  Tang, Yan;  Deng, Qinyuan;  Zhao, Lixin;  Hu, Song
Adobe PDF(987Kb)  |  Favorite  |  View/Download：60/0  |  Submit date：2018/11/20
SOLID IMMERSION LENS  RESOLUTION  NANOSCOPE  SINGLE  
Dimensional metrology of micro structure based on modulation depth in scanning broadband light interferometry 会议论文
0277-786X
Authors:  Zhou, Yi;  Tang, Yan;  Deng, Qinyuan;  Zhao, Lixin;  Hu, Song
Adobe PDF(606Kb)  |  Favorite  |  View/Download：60/0  |  Submit date：2018/12/20
Microstructure - Modulation - Surface topography - Units of measurement