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Efficient subpixel registration for polarization-modulated 3D imaging 期刊论文
OPTICS EXPRESS, 2018, 卷号: 26, 期号: 18, 页码: 23040-23050
Authors:  Chen, Zhen;  Liu, Bo;  Wang, Shengjie;  Liu, Enhai
Adobe PDF(3094Kb)  |  Favorite  |  View/Download:5/0  |  Submit date:2019/08/23
Image reconstruction  Imaging systems  Pixels  Polarization  
Topography measurement of large-rangemicrostructures through advanced fourier-transformmethod and phase stitching in scanning broadband light interferometry 期刊论文
Micromachines, 2017, 卷号: 8, 期号: 11, 页码: 319
Authors:  Zhou, Yi;  Tang, Yan;  Yang, Yong;  Hu, Song
Adobe PDF(4569Kb)  |  Favorite  |  View/Download:20/0  |  Submit date:2018/11/20
Microstructure - Modulation - Pixels - Topography  
Performance test and image correction of CMOS image sensor in radiation environment 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96841H
Authors:  Wang, Congzheng;  Hu, Song;  Gao, Chunming;  Feng, Chang
Adobe PDF(764Kb)  |  Favorite  |  View/Download:43/0  |  Submit date:2018/06/14
Cmos Integrated Circuits  Digital Cameras  Digital Storage  Equipment  Gamma Rays  Image Reconstruction  Image Sensors  Ionizing Radiation  Manufacture  Optical Data Processing  Optical Testing  Pixels  Radiation  Signal To Noise Ratio  
Topography measurement of micro structure by modulation-based method 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968505
Authors:  Zhou, Yi;  Tang, Yan;  Liu, Junbo;  Deng, Qinyuan;  Cheng, Yiguang;  Hu, Song
Adobe PDF(505Kb)  |  Favorite  |  View/Download:32/0  |  Submit date:2018/06/14
Interferometry  Light Sources  Manufacture  Materials Testing  Microstructure  Optical Devices  Pixels  Surface Measurement  Topography  
Large-scale absolute surface reconstruction 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96843L
Authors:  Wu, Gao-Feng;  Quan, Hai-Yang;  Song, Wei-Hong;  Wu, Yong-Qian
Adobe PDF(601Kb)  |  Favorite  |  View/Download:29/0  |  Submit date:2018/06/14
Image Resolution  Interferometry  Inverse Problems  Iterative Methods  Manufacture  Optical Testing  Pixels  
Evaluating surface repeatability for interferometric measurement: A comparative study 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96842M
Authors:  Quan, Haiyang;  Xi, Hou;  Fan, Wu
Adobe PDF(457Kb)  |  Favorite  |  View/Download:32/0  |  Submit date:2018/06/14
Manufacture  Optical Testing  Pixels  Statistics  Uncertainty Analysis  
Detection for flatness of large surface based on structured light 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96841W
Authors:  He, Wenyan;  Cao, Xuedong;  Long, Kuang;  Peng, Zhang
Adobe PDF(482Kb)  |  Favorite  |  View/Download:41/0  |  Submit date:2018/06/14
Imaging Systems  Manufacture  Pixels