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中国科学院光电技术研究所机构知识库
Knowledge Management System Of Institute of optics and electronics, CAS
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Removal of paint layer by layer using a 20 kHz 140 ns quasi-continuous wave laser
期刊论文
OPTIK, 2018, 卷号: 174, 页码: 46-55
Authors:
Zhang, Zhiyan
;
Zhang, Jingyuan
;
Wang, Yibo
;
Zhao, Shusen
;
Lin, Xuechun
;
Li, Xinyang
Adobe PDF(1847Kb)
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View/Download:29/0
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Submit date:2019/08/23
High repetition rate
Quasi-continuous wave laser
Multi-layer paint
Removal layer by layer
Three-dimensional coherent transfer function in reflection-mode confocal microscopy with two-zone phase filters
期刊论文
OPTIK, 2018, 卷号: 170, 页码: 70-81
Authors:
Li, Lingxiao
;
He, Yi
;
Wang, Yuanyuan
;
Li, Xiqi
;
Wei, Ling
;
Yang, Jinsheng
;
Zhang, Yudong
Adobe PDF(2397Kb)
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Submit date:2019/08/23
Apertures
Imaging systems
Diffraction theory
Dynamic patterns based on the superposition of micropattern array and microlens array
期刊论文
OPTIK, 2018, 卷号: 174, 页码: 244-251
Authors:
Huang, Peng
;
He, Chuanwang
;
Fan, Bin
;
Dong, Xiaochun
Adobe PDF(3050Kb)
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Submit date:2019/08/23
Moire techniques
Dynamic
Microlens Array
Pattern
The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry
期刊论文
OPTIK, 2018, 卷号: 170, 页码: 95-100
Authors:
Yao, Benxi
;
Gu, Naiting
;
Rao, Changhui
Adobe PDF(367Kb)
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Submit date:2019/08/23
Intensity scintillation
Polarimetry error
Polarizing beam splitter
Improving the performance of single point diamond turning surface with ion beam figuring
期刊论文
OPTIK, 2018, 卷号: 172, 页码: 540-544
Authors:
Huang, Yuetian
;
Fan, Bin
;
Wan, Yongjian
;
Li, Shijie
Adobe PDF(1070Kb)
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Submit date:2019/08/23
Single point diamond turning
Turning marks
Ion beam figuring
Surface precision
Optimization of SIFT algorithm for fast-image feature extraction in line-scanning ophthalmoscope
期刊论文
OPTIK, 2018, 卷号: 152, 页码: 21-28
Authors:
He, Yi
;
Deng, Guohua
;
Wang, Yuanyuan
;
Wei, Ling
;
Yang, Jinsheng
;
Li, Xiqi
;
Zhang, Yudong
Adobe PDF(1375Kb)
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View/Download:28/0
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Submit date:2019/08/23
Confocal microscopy
Retina scanning
Medical and biological imaging
Feature extraction
Image matching
SIFT
Determination of infrared refractive index of ZnS and YbF3 thin films by spectroscopy
期刊论文
OPTIK, 2018, 卷号: 170, 页码: 321-327
Authors:
Zhang, Yinhua
;
Zhang, Kepeng
;
Huang, Wei
;
Xiong, Shengming
Adobe PDF(838Kb)
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Submit date:2019/08/23
YbF3 thin film
ZnS thin film
Refractive index
Transmittance spectra
Interferometric array configuration design for the expected UV-plane coverage
期刊论文
OPTIK, 2018, 卷号: 158, 页码: 1443-1449
Authors:
Huang, Siyu
;
Guo, Youming
;
Rao, Changhui
Adobe PDF(1301Kb)
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Submit date:2019/08/23
Interferometric array
Array configuration design
UV-plane coverage
Removing apertures
A no-reference image blurriness metric in the spatial domain
期刊论文
OPTIK, 2016, 卷号: 127, 期号: 14, 页码: 5568-5575
Authors:
Hong, Yuzhen
;
Ren, Guoqiang
;
Liu, Enhai
Adobe PDF(1370Kb)
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Submit date:2016/10/27
Sharpness Metric
Blurriness Metric
Image Quality Assessment
Spatial Domain
Jnb
No-reference
Nanobowl array fabrication based on nanoimprint lithography
期刊论文
OPTIK, 2016, 卷号: 127, 期号: 1, 页码: 145-147
Authors:
Zhang, Man
;
Deng, Qiling
;
Shi, Lifang
;
Cao, Axiu
;
Pang, Hui
;
Hu, Song
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View/Download:79/0
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Submit date:2016/06/27
Nanobowl Array
Self-assembly
Nanoimprint Lithography
Lift-off