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Thermal Stability of Mid-infrared SiO2Thin Films Deposited by Dual Ion Beam Sputtering Method 期刊论文
Guangzi Xuebao/Acta Photonica Sinica, 2017, 卷号: 46, 期号: 8, 页码: 0816003
Authors:  Shang, Peng;  Ji, Yi-Qin;  Zhao, Dao-Ling;  Xiong, Sheng-Ming;  Liu, Hua-Song;  Li, Ling-Hui;  Tian, Dong
Adobe PDF(2071Kb)  |  Favorite  |  View/Download:27/0  |  Submit date:2018/11/20
Ions - Microstructure - Optical coatings - Residual stresses - Sapphire - Silica - Sputtering - Stability - Thermodynamic stability - Thin films