IOE OpenIR

Browse/Search Results:  1-7 of 7 Help

Selected(0)Clear Items/Page:    Sort:
基于光线追迹和特征函数的非球面干涉检测系统建模及应用研究 学位论文
, 北京: 中国科学院大学, 2018
Authors:  何一苇
Adobe PDF(5991Kb)  |  Favorite  |  View/Download:59/1  |  Submit date:2018/05/23
光线追迹  特征函数  光学建模  计算全息  变形镜  非球面检测  
Modeling near-null testing method of a freeform surface with a deformable mirror compensator 期刊论文
Applied Optics, 2017, 卷号: 56, 期号: 33, 页码: 9132-9138
Authors:  He, Yiwei;  Huang, Lei;  Hou, Xi;  Fan, Wu;  Liang, Rongguang
Adobe PDF(1180Kb)  |  Favorite  |  View/Download:24/0  |  Submit date:2018/11/20
Constrained optimization - Deformation - Fits and tolerances - Mirrors - Testing  
Analysis of spurious diffraction orders of computer-generated hologram in symmetric aspheric metrology 期刊论文
Optics Express, 2017, 卷号: 25, 期号: 17, 页码: 20556-20572
Authors:  He, Yiwei;  Hou, Xi;  Wu, Fan;  Ma, Xinxue;  Liang, Rongguang
Adobe PDF(4237Kb)  |  Favorite  |  View/Download:38/0  |  Submit date:2018/11/20
Aspherics - Diffraction - Electron holography - Holograms - Imaging systems - Units of measurement  
Analysis of adjustment error in aspheric null testing with CGH 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 968444
Authors:  He, Yiwei;  Xi, Hou;  Chen, Qiang;  Li, Chaoqiang;  Zhu, Xiaoqiang;  Song, Weihong
Adobe PDF(1480Kb)  |  Favorite  |  View/Download:30/0  |  Submit date:2018/06/14
Aspherics  Electron Holography  Errors  Holograms  Lithography  Manufacture  Optical Testing  Wavefronts  
Retrace error reconstruction based on point characteristic function 期刊论文
OPTICS EXPRESS, 2015, 卷号: 23, 期号: 22
Authors:  He Yiwei;  Hou, Xi;  Quan Haiyang;  Song, Weihong
Favorite  |  View/Download:95/0  |  Submit date:2016/02/03
Modeling Fizeau interferometer based on ray tracing with Zemax 会议论文
, 2015
Authors:  He, Yiwei;  Hou, Xi;  Wu, Yongqian;  Wu, Fan;  Quan, Haiyang;  Liu, Fengwei
Adobe PDF(510Kb)  |  Favorite  |  View/Download:42/0  |  Submit date:2016/11/24
Retrace error reconstruction based on point characteristic function 期刊论文
Optics Express, 2015, 卷号: 23, 期号: 22, 页码: 28216-28223
Authors:  Yiwei, He;  Hou, Xi;  Haiyang, Quan;  Song, Weihong
Adobe PDF(1697Kb)  |  Favorite  |  View/Download:46/0  |  Submit date:2016/11/22