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Determination of refractive index and thickness of YbF3 thin films deposited at different bias voltages of APS ion source from spectrophotometric methods 期刊论文
ADVANCED OPTICAL TECHNOLOGIES, 2018, 卷号: 7, 期号: 1-2, 页码: 33-37
Authors:  Zhang, Yinhua;  Xiong, Shengming;  Huang, Wei;  Zhang, Kepeng
Adobe PDF(409Kb)  |  Favorite  |  View/Download:12/0  |  Submit date:2019/08/23
Bias Voltage  Refractive Index  Transmittance Spectra  Ybf3 Thin Film  
Determination of infrared refractive index of ZnS and YbF3 thin films by spectroscopy 期刊论文
OPTIK, 2018, 卷号: 170, 页码: 321-327
Authors:  Zhang, Yinhua;  Zhang, Kepeng;  Huang, Wei;  Xiong, Shengming
Adobe PDF(838Kb)  |  Favorite  |  View/Download:15/0  |  Submit date:2019/08/23
YbF3 thin film  ZnS thin film  Refractive index  Transmittance spectra  
Influence of deposition parameters on residual stress of YbF3 thin film 期刊论文
Proceedings of SPIE: Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 2016, 卷号: 9796, 页码: 97960N
Authors:  Zhang, Yao-Ping;  Fan, Jun-Qi;  Long, Guo-Yun
Adobe PDF(539Kb)  |  Favorite  |  View/Download:33/0  |  Submit date:2018/06/14
Adaptive Optics  Coatings  Deposition  Ion Beam Assisted depositIon  Monocrystalline Silicon  Reflective Coatings  Refractive Index  Residual Stresses  Space Debris  Sputtering