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穆勒矩阵椭偏测量系统高级参数问题研究 学位论文
工学博士, 中国科学院光电技术研究所: 中国科学院大学, 2019
Authors:  范真涛
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穆勒矩阵椭偏测量系统,高级参数,双旋转补偿器,误差分析,偏振相关系数,参数标定  
基于散射测量的光学元件表面质量评估方法研究 学位论文
工学博士, 中国科学院光电技术研究所: 中国科学院大学, 2019
Authors:  张科鹏
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光学元件+光学薄膜+光散射  
Application of first-order nonparaxial scalar theory to determine surface scattering intensity of multilayer optical coatings 期刊论文
OPTICS EXPRESS, 2018, 卷号: 26, 期号: 26, 页码: 34592-34608
Authors:  Zhang, Kepeng;  Huang, Wei;  Zhang, Bin;  Tian, Xiaoxi;  Zhang, Yinhua;  Guan, Chunlin
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Multilayers  Optical coatings  Optical multilayers  Surface scattering  
Single-Walled Carbon Nanotube-Controlled Meyer-Neldel Rules in Vanadium Oxide Films for Applications as Thermistor Materials in Sensors and Detectors 期刊论文
ACS APPLIED NANO MATERIALS, 2018, 卷号: 1, 期号: 12, 页码: 6959-6966
Authors:  Qiong He;  Xiangdong Xu;  Yu Gu;  Xiaomeng Cheng;  Jimmy Xu;  Yadong Jiang
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electrical conductivity  Meyer-Neldel rule (MNR)  vanadium oxides  carbon nanotubes  composite films  
Performance optimization of 93 nm antireflective coatings with wide incident angle ranges on strongly curved spherical substrates 期刊论文
OPTICS EXPRESS, 2018, 卷号: 26, 期号: 15, 页码: 19524-19533
Authors:  Liu, Cunding;  Kong, Mingdong;  Li, Bincheng
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Antireflection coatings  Atomic force microscopy  Film thickness  Lanthanum compounds  Magnesium compounds  Refractive index  Spheres  
Calibration of focusing lens artifacts in a dual rotating-compensator Mueller matrix ellipsometer 期刊论文
APPLIED OPTICS, 2018, 卷号: 57, 期号: 15, 页码: 4145-4152
Authors:  Fan, Zhentao;  Tang, Yuanyuan;  Wei, Kai;  Zhang, Yudong
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Calibration  Ellipsometry  Focusing  Light measurement  Matrix algebra  
Determination of refractive index and thickness of YbF3 thin films deposited at different bias voltages of APS ion source from spectrophotometric methods 期刊论文
ADVANCED OPTICAL TECHNOLOGIES, 2018, 卷号: 7, 期号: 1-2, 页码: 33-37
Authors:  Zhang, Yinhua;  Xiong, Shengming;  Huang, Wei;  Zhang, Kepeng
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Bias Voltage  Refractive Index  Transmittance Spectra  Ybf3 Thin Film  
Surface imaging microscopy with tunable penetration depth as short as 20 nm by employing hyperbolic metamaterials 期刊论文
JOURNAL OF MATERIALS CHEMISTRY C, 2018, 卷号: 6, 期号: 7, 页码: 1797-1805
Authors:  Kong, Weijie;  Du, Wenjuan;  Liu, Kaipeng;  Liu, Hongchao;  Zhao, Zeyu;  Pu, Mingbo;  Wang, Changtao;  Luo, Xiangang
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Cell membranes  Fluorescence  
Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopy 期刊论文
OPTICS EXPRESS, 2018, 卷号: 26, 期号: 3, 页码: 2944-2953
Authors:  Xie, Zhongye;  Tang, Yan;  Zhou, Yi;  Deng, Qinyuan
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Digital devices  Film thickness  Interferometry  Modulation  Thickness measurement  
Large area deep subwavelength interference lithography with a 35 nm half-period based on bulk plasmon polaritons 期刊论文
OPTICAL MATERIALS EXPRESS, 2018, 卷号: 8, 期号: 2, 页码: 199-209
Authors:  Liu, Hongchao;  Luo, Yunfei;  Kong, Weijie;  Liu, Kaipeng;  Du, Wenjuan;  Zhao, Chengwei;  Gao, Ping;  Zhao, Zeyu;  Wang, Changtao;  Pu, Mingbo;  Luo, Xiangang
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