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Accurate determination of electronic transport properties of silicon wafers by nonlinear photocarrier radiometry with multiple pump beam sizes 期刊论文
Journal of Applied Physics, 2015, 卷号: 118, 期号: 21, 页码: 215707
Authors:  Wang, Qian;  Li, Bincheng;  Li, Bincheng (bcli@uestc.ac.cn)
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Electronic transport characterization of silicon wafers by spatially resolved steady-state photocarrier radiometric imaging 期刊论文
Journal of Applied Physics, 2015, 卷号: 118, 期号: 12, 页码: 125705
Authors:  Wang, Qian;  Li, Bincheng
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