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Combined frequency- and time-domain photocarrier radiometry characterization of ion-implanted and thermally annealed silicon wafers 期刊论文
Chinese Physics B, 2013, 卷号: 22, 期号: 5, 页码: 057202
Authors:  Ren, Sheng-Dong;  Li, Bin-Cheng;  Gao, Li-Feng;  Wang, Qian;  Li, B.-C. (bcli@ioe.ac.cn)
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