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Performance optimization of 93 nm antireflective coatings with wide incident angle ranges on strongly curved spherical substrates 期刊论文
OPTICS EXPRESS, 2018, 卷号: 26, 期号: 15, 页码: 19524-19533
Authors:  Liu, Cunding;  Kong, Mingdong;  Li, Bincheng
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Antireflection coatings  Atomic force microscopy  Film thickness  Lanthanum compounds  Magnesium compounds  Refractive index  Spheres  
Correlation between 193nm absorption and photoluminescence-related defects for fused silica materials 期刊论文
OPTICAL MATERIALS EXPRESS, 2018, 卷号: 8, 期号: 4, 页码: 775-784
Authors:  Zhou, Jiangning;  Li, Bincheng
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Defects  Irradiation  Laser excitation  Photoluminescence  Two photon processes  
NiCrNxinterlayer thickness dependence of spectral performance and environmental durability of protected-silver mirrors 期刊论文
Optical Engineering, 2018, 卷号: 57, 期号: 4, 页码: 045101
Authors:  Xu, Xu;  Li, Bincheng;  He, Wenyan;  Wang, Changjun;  Wei, Ming
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Chromium compounds  Corrosion protection  Corrosion resistance  Durability  Environmental testing  Mirrors  Reflection  Scanning electron microscopy  Silver  
Determination of refractive index and thickness of YbF3 thin films deposited at different bias voltages of APS ion source from spectrophotometric methods 期刊论文
ADVANCED OPTICAL TECHNOLOGIES, 2018, 卷号: 7, 期号: 1-2, 页码: 33-37
Authors:  Zhang, Yinhua;  Xiong, Shengming;  Huang, Wei;  Zhang, Kepeng
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Bias Voltage  Refractive Index  Transmittance Spectra  Ybf3 Thin Film  
Sensitive measurement of stress birefringence of fused silica substrates with cavity ring-down technique 期刊论文
OPTICS LETTERS, 2018, 卷号: 43, 期号: 4, 页码: 843-846
Authors:  Xiao, Shilei;  Li, Bincheng;  Cui, Hao;  Wang, Jing
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Birefringence  Light measurement  Substrates  
Pressure optimization of an EC-QCL based cavity ring-down spectroscopy instrument for exhaled NO detection 期刊论文
APPLIED PHYSICS B-LASERS AND OPTICS, 2018, 卷号: 124, 期号: 2, 页码: 27
Authors:  Zhou, Sheng;  Han, Yanling;  Li, Bincheng
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Absorption spectroscopy  Band structure  Infrared devices  Nitric oxide  Quantum cascade lasers  
Configuration optimization of photothermal deflection for measurement sensitivity enhancement 期刊论文
REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 卷号: 89, 期号: 2, 页码: 24901
Authors:  Zhang, Xiaorong;  Li, Bincheng
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Diffraction  Probes  Thermoelasticity  
Determination of infrared refractive index of ZnS and YbF3 thin films by spectroscopy 期刊论文
OPTIK, 2018, 卷号: 170, 页码: 321-327
Authors:  Zhang, Yinhua;  Zhang, Kepeng;  Huang, Wei;  Xiong, Shengming
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YbF3 thin film  ZnS thin film  Refractive index  Transmittance spectra  
Reflectivity mapping of large-aperture mirrors with cavity ringdown technique 期刊论文
Applied Optics, 2017, 卷号: 56, 期号: 4, 页码: C35-C40
Authors:  Han, Yanling;  Li, Bincheng;  Gao, Lifeng;  Xiong, Shengming
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Mapping - Mirrors  
Characterization of surface defects of silicon substrates by the total scattering and absorption 会议论文
0277-786X
Authors:  Zhang, Kepeng;  Zhang, Xingxin;  Huang, Wei
Adobe PDF(461Kb)  |  Favorite  |  View/Download:34/0  |  Submit date:2018/12/20
Absorption - Atomic force microscopy - Brillouin scattering - Light scattering - Microscopes - Optical systems - Photonics - Reflection - Silicon - Substrates - Surface roughness - Surface scattering