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Department微电子装备总体研究室(四室)
Nuclear Radiation Degradation Study on HD Camera Based on CMOS Image Sensor at Different Dose Rates
Wang, Congzheng1,2,3; Hu, Song1; Gao, Chunming2; Feng, Chang1
Source PublicationSENSORS
Volume18Issue:2Pages:514
2018-02-01
Language英语
ISSN1424-8220
DOI10.3390/s18020514
Indexed BySCI ; Ei
WOS IDWOS:000427544000197
EI Accession Number20180704797482
SubtypeJ
AbstractIn this work, we irradiated a high-definition (HD) industrial camera based on a commercial-off-the-shelf (COTS) CMOS image sensor (CIS) with Cobalt-60 gamma-rays. All components of the camera under test were fabricated without radiation hardening, except for the lens. The irradiation experiments of the HD camera under biased conditions were carried out at 1.0, 10.0, 20.0, 50.0 and 100.0 Gy/h. During the experiment, we found that the tested camera showed a remarkable degradation after irradiation and differed in the dose rates. With the increase of dose rate, the same target images become brighter. Under the same dose rate, the radiation effect in bright area is lower than that in dark area. Under different dose rates, the higher the dose rate is, the worse the radiation effect will be in both bright and dark areas. And the standard deviations of bright and dark areas become greater. Furthermore, through the progressive degradation analysis of the captured image, experimental results demonstrate that the attenuation of signal to noise ratio (SNR) versus radiation time is not obvious at the same dose rate, and the degradation is more and more serious with increasing dose rate. Additionally, the decrease rate of SNR at 20.0, 50.0 and 100.0 Gy/h is far greater than that at 1.0 and 10.0 Gy/h. Even so, we confirm that the HD industrial camera is still working at 10.0 Gy/h during the 8 h of measurements, with a moderate decrease of the SNR (5 dB). The work is valuable and can provide suggestion for camera users in the radiation field.
KeywordCMOS image sensor radiation damage dose rate HD camera
WOS KeywordACTIVE PIXEL ; PERFORMANCE
EI KeywordsCMOS integrated circuits ; Digital cameras ; Digital television ; Gamma rays ; Image sensors ; Irradiation ; Radiation damage ; Radiation hardening
EI Classification Number714.2 Semiconductor Devices and Integrated Circuits ; 716.1 Information Theory and Signal Processing ; 716.4 Television Systems and Equipment ; 742.2 Photographic Equipment ; 931.3 Atomic and Molecular Physics
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Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/9365
Collection微电子装备总体研究室(四室)
Affiliation1.Institute of Optics and Electronics, Chinese Academy of Sciences, No. 1 Guangdian Avenue Xihang Port, Shuangliu, Chengdu; 610209, China;
2.School of Optoelectronic Information, University of Electronic Science and Technology of China, No. 4, Block 2, North Jianshe Road, Chengdu; 610054, China;
3.University of Chinese Academy of Sciences, No. 19, Yuquan Road, Shijingshan District, Beijing; 100049, China
Recommended Citation
GB/T 7714
Wang, Congzheng,Hu, Song,Gao, Chunming,et al. Nuclear Radiation Degradation Study on HD Camera Based on CMOS Image Sensor at Different Dose Rates[J]. SENSORS,2018,18(2):514.
APA Wang, Congzheng,Hu, Song,Gao, Chunming,&Feng, Chang.(2018).Nuclear Radiation Degradation Study on HD Camera Based on CMOS Image Sensor at Different Dose Rates.SENSORS,18(2),514.
MLA Wang, Congzheng,et al."Nuclear Radiation Degradation Study on HD Camera Based on CMOS Image Sensor at Different Dose Rates".SENSORS 18.2(2018):514.
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