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Department自适应光学技术研究室(八室)
The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry
Yao, Benxi1,2,3; Gu, Naiting1,2; Rao, Changhui1,2
Source PublicationOPTIK
Volume170Pages:95-100
2018
Language英语
ISSN0030-4026
DOI10.1016/j.ijleo.2018.05.060
Indexed BySCI ; Ei
WOS IDWOS:000440882500013
EI Accession Number20182205262556
SubtypeJ
AbstractThe imaging polarimeter is an important tool to measure polarization properties to reconstruct solar magnetic field in solar observation, to discriminate between benign and malignant moles in the living human eye, and so on. In single-pass imaging polarimetry, the intensity scintillation induced by the source's instability or the seeing during the signals obtaining period will induce severe measurement error. Double-pass imaging polarimetry can significantly decrease this influence. In this paper, we have analyzed the measurement error induced by the intensity scintillation for single-pass and double-pass imaging polarimetries. And the simulation and experiment are presented. Their results are coincident with each other.
KeywordIntensity scintillation Polarimetry error Polarizing beam splitter
WOS KeywordSOLAR TELESCOPE
EI KeywordsElectromagnetic field effects ; Ellipsometry ; Measurement errors ; Scintillation
EI Classification Number701.1 Electricity: Basic Concepts and Phenomena ; 741.1 Light/Optics ; 941.3 Optical Instruments ; 941.4 Optical Variables Measurements
Citation statistics
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/9354
Collection自适应光学技术研究室(八室)
Affiliation1.The Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu; 610209, China;
2.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China;
3.University of Chinese Academy of Sciences, No.19A Yuquan Road, Beijing; 100049, China
Recommended Citation
GB/T 7714
Yao, Benxi,Gu, Naiting,Rao, Changhui. The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry[J]. OPTIK,2018,170:95-100.
APA Yao, Benxi,Gu, Naiting,&Rao, Changhui.(2018).The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry.OPTIK,170,95-100.
MLA Yao, Benxi,et al."The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry".OPTIK 170(2018):95-100.
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