| Dynamic metrology and data processing for precision freeform optics fabrication and testing | |
| Aftab, Maham1; Trumper, Isaac1; Huang, Lei2; Choi, Heejoo1; Zhao, Wenchuan3; Graves, Logan1; Oh, Chang Jin1; Kim, Dae Wook1,4 | |
| 2017 | |
| Conference Name | Proceedings of SPIE: Fourth European Seminar on Precision Optics Manufacturing |
| Source Publication | 0277-786X |
| Volume | 10326 |
| Pages | 103260H |
| Abstract | Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed. © 2017 SPIE. |
| Keyword | Adaptive optics - Data processing - Gradient methods - Manufacture - Measurements - Optical systems - Optical testing - Stochastic systems - Units of measurement |
| Indexed By | Ei |
| Language | 英语 |
| EI Classification Number | 2017-2163 |
| Document Type | 会议论文 |
| Identifier | http://ir.ioe.ac.cn/handle/181551/9031 |
| Collection | 先光中心 |
| Affiliation | 1.College of Optical Sciences, University of Arizona, Tucson; AZ; 85721, United States; 2.Department of Precision Instruments, Tsinghua University, Beijing; 100084, China; 3.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China; 4.Steward Observatory, University of Arizona, Tucson; AZ; 85721, United States |
| Recommended Citation GB/T 7714 | Aftab, Maham,Trumper, Isaac,Huang, Lei,et al. Dynamic metrology and data processing for precision freeform optics fabrication and testing[C],2017:103260H. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 2017-2163.pdf（614KB） | 会议论文 | 开放获取 | CC BY-NC-SA | Application Full Text | ||
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