Dynamic metrology and data processing for precision freeform optics fabrication and testing | |
Aftab, Maham1; Trumper, Isaac1; Huang, Lei2; Choi, Heejoo1; Zhao, Wenchuan3; Graves, Logan1; Oh, Chang Jin1; Kim, Dae Wook1,4 | |
Source Publication | 0277-786X |
Volume | 10326 |
Pages | 103260H |
2017 | |
Language | 英语 |
Indexed By | Ei |
Abstract | Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed. © 2017 SPIE. |
Keyword | Adaptive optics - Data processing - Gradient methods - Manufacture - Measurements - Optical systems - Optical testing - Stochastic systems - Units of measurement |
Conference Name | Proceedings of SPIE: Fourth European Seminar on Precision Optics Manufacturing |
EI Classification Number | 2017-2163 |
Document Type | 会议论文 |
Identifier | http://ir.ioe.ac.cn/handle/181551/9031 |
Collection | 先光中心 |
Affiliation | 1.College of Optical Sciences, University of Arizona, Tucson; AZ; 85721, United States; 2.Department of Precision Instruments, Tsinghua University, Beijing; 100084, China; 3.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China; 4.Steward Observatory, University of Arizona, Tucson; AZ; 85721, United States |
Recommended Citation GB/T 7714 | Aftab, Maham,Trumper, Isaac,Huang, Lei,et al. Dynamic metrology and data processing for precision freeform optics fabrication and testing[C],2017:103260H. |
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2017-2163.pdf(614KB) | 会议论文 | 开放获取 | CC BY-NC-SA | Application Full Text |
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