Dimensional metrology of micro structure based on modulation depth in scanning broadband light interferometry | |
Zhou, Yi1,2; Tang, Yan1; Deng, Qinyuan1,2; Zhao, Lixin1; Hu, Song1 | |
Source Publication | 0277-786X |
Volume | 10373 |
Pages | 103730G |
2017 | |
Language | 英语 |
Indexed By | Ei |
Abstract | Three-dimensional measurement and inspection is an area with growing needs and interests in many domains, such as integrated circuits (IC), medical cure, and chemistry. Among the methods, broadband light interferometry is widely utilized due to its large measurement range, noncontact and high precision. In this paper, we propose a spatial modulation depth-based method to retrieve the surface topography through analyzing the characteristics of both frequency and spatial domains in the interferogram. Due to the characteristics of spatial modulation depth, the technique could effectively suppress the negative influences caused by light fluctuations and external disturbance. Both theory and experiments are elaborated to confirm that the proposed method can greatly improve the measurement stability and sensitivity with high precision. This technique can achieve a superior robustness with the potential to be applied in online topography measurement. © 2017 SPIE. |
Keyword | Microstructure - Modulation - Surface topography - Units of measurement |
Conference Name | Proceedings of SPIE: Applied Optical Metrology II |
EI Classification Number | 2017-2159 |
Document Type | 会议论文 |
Identifier | http://ir.ioe.ac.cn/handle/181551/9027 |
Collection | 微电子装备总体研究室(四室) |
Affiliation | 1.State Key Lab. of Optical Technol. for Microfabrication, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China; 2.University of Chinese Academy of Sciences, Beijing; 100049, China |
Recommended Citation GB/T 7714 | Zhou, Yi,Tang, Yan,Deng, Qinyuan,et al. Dimensional metrology of micro structure based on modulation depth in scanning broadband light interferometry[C],2017:103730G. |
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2017-2159.pdf(606KB) | 会议论文 | 开放获取 | CC BY-NC-SA | Application Full Text |
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