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基于编码器测速的双闭环控制系统性能分析
陈思思; 黄宣琳; 黄永梅; 唐涛
Source Publication国外电子测量技术
Volume36Issue:11Pages:30-33
2017
Language中文
ISSN1002-8978
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/8946
Collection光电工程总体研究室(一室)
Recommended Citation
GB/T 7714
陈思思,黄宣琳,黄永梅,等. 基于编码器测速的双闭环控制系统性能分析[J]. 国外电子测量技术,2017,36(11):30-33.
APA 陈思思,黄宣琳,黄永梅,&唐涛.(2017).基于编码器测速的双闭环控制系统性能分析.国外电子测量技术,36(11),30-33.
MLA 陈思思,et al."基于编码器测速的双闭环控制系统性能分析".国外电子测量技术 36.11(2017):30-33.
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