| 精密光学元件表面疵病检测技术研究 | |
| 江晓亮; 杨小军; 邓小雷; 李柏林; 赵文川 | |
| Source Publication | 传感器与微系统
 |
| Volume | 36Issue:11Pages:25-27+31 |
| 2017 | |
| Language | 中文 |
| ISSN | 1000-9787 |
| Document Type | 期刊论文 |
| Identifier | http://ir.ioe.ac.cn/handle/181551/8908 |
| Collection | 先光中心 |
| Recommended Citation GB/T 7714 | 江晓亮,杨小军,邓小雷,等. 精密光学元件表面疵病检测技术研究[J]. 传感器与微系统,2017,36(11):25-27+31. |
| APA | 江晓亮,杨小军,邓小雷,李柏林,&赵文川.(2017).精密光学元件表面疵病检测技术研究.传感器与微系统,36(11),25-27+31. |
| MLA | 江晓亮,et al."精密光学元件表面疵病检测技术研究".传感器与微系统 36.11(2017):25-27+31. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 2017-1005.pdf（1286KB） | 期刊论文 | 出版稿 | 开放获取 | CC BY-NC-SA | Application Full Text | |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment