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精密光学元件表面疵病检测技术研究
江晓亮; 杨小军; 邓小雷; 李柏林; 赵文川
Source Publication传感器与微系统
Volume36Issue:11Pages:25-27+31
2017
Language中文
ISSN1000-9787
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/8908
Collection先光中心
Recommended Citation
GB/T 7714
江晓亮,杨小军,邓小雷,等. 精密光学元件表面疵病检测技术研究[J]. 传感器与微系统,2017,36(11):25-27+31.
APA 江晓亮,杨小军,邓小雷,李柏林,&赵文川.(2017).精密光学元件表面疵病检测技术研究.传感器与微系统,36(11),25-27+31.
MLA 江晓亮,et al."精密光学元件表面疵病检测技术研究".传感器与微系统 36.11(2017):25-27+31.
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