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Simultaneous mapping of reflectance, transmittance and optical loss of highly reflective and anti-reflective coatings with two-channel cavity ring-down technique
Cui, Hao1,2; Li, Bincheng1,2; Xiao, Shilei1; Han, Yanling2; Wang, Jing1; Gao, Chunming1; Wang, Yafei1
Source PublicationOptics Express
Volume25Issue:5Pages:5807-5820
2017
Language英语
ISSN1094-4087
Indexed BySCI ; Ei
AbstractWe demonstrate the use of a two-channel cavity ring-down (CRD) technique for simultaneously measuring/mapping the reflectance R, transmittance T and optical loss L (absorption plus scattering losses) of highly reflective (HR) and anti-reflective (AR) laser components. High reflectance/transmittance of HR/AR components is measured with the ring-down time of CRD signals, while the low residual transmittance/ reflectance of HR/AR components is determined by the amplitude ratio of two CRD signals, and the optical loss is then determined via L = 1-R-T. Experiments are performed to measure and map R, T, and L of HR mirrors with different transmittance levels from below 1ppm to about 70 ppm (part-permillion) and of one AR window at 635nm. For a 4 ppm-transmittance HR mirror, the measured R, T, and L at one position are 99.99821 ± 0.00004%, 4.042 ± 0.008 ppm and 13.9 ± 0.4 ppm, respectively. For the AR sample, the measured T, R, and L at one position are 99.99279 ± 0.00004%, 50.0 ± 0.7 ppm and 22.0 ± 0.4 ppm, respectively. The sub-ppm standard deviations for R, T, and L indicate the high accuracy of the two-channel CRD technique for the simultaneous measurements of reflectivity, transmittance and optical loss of HR and AR components. High-resolution mappings of R, T, and L of both HR and AR samples are demonstrated. The simultaneous measurements/mappings of reflectance, transmittance, and optical loss with sub-ppm accuracy are of great importance to the preparation of high-performance laser optics for applications such as gravitational-wave detection and laser gyroscopes. © 2017 Optical Society of America.
KeywordAntireflection coatings - Gravity waves - Light measurement - Mapping - Mirrors - Optical losses - Reflective coatings
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/8866
Collection薄膜光学技术研究室(十一室)
Affiliation1.School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu; 610054, China;
2.Institute of Optics and Electronics, Chinese Academy of Sciences, P. O. Box 350, Shuangliu, Chengdu; 610209, China
Recommended Citation
GB/T 7714
Cui, Hao,Li, Bincheng,Xiao, Shilei,et al. Simultaneous mapping of reflectance, transmittance and optical loss of highly reflective and anti-reflective coatings with two-channel cavity ring-down technique[J]. Optics Express,2017,25(5):5807-5820.
APA Cui, Hao.,Li, Bincheng.,Xiao, Shilei.,Han, Yanling.,Wang, Jing.,...&Wang, Yafei.(2017).Simultaneous mapping of reflectance, transmittance and optical loss of highly reflective and anti-reflective coatings with two-channel cavity ring-down technique.Optics Express,25(5),5807-5820.
MLA Cui, Hao,et al."Simultaneous mapping of reflectance, transmittance and optical loss of highly reflective and anti-reflective coatings with two-channel cavity ring-down technique".Optics Express 25.5(2017):5807-5820.
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