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Optic flaws detection and location based on a plenoptic camera
Luan, Yinsen1,2,3; Xu, Bing1,2; Yang, Ping1,2; Tang, Guomao1,2
2017
Source PublicationChinese Optics Letters
ISSN1671-7694
Volume15Issue:4Pages:041102
AbstractIn this Letter, we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics. Specifically, due to the extended depth of field of the plenoptic camera, a series of optics can be inspected efficiently and simultaneously. Moreover, the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them. Besides, the detection and location can be implemented with a single snapshot of the plenoptic camera. Consequently, this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics, which may lead to performance degradation of optical systems. © 2017 Chinese Optics Letters.
KeywordInspection - Location
Indexed BySCI ; Ei
Language英语
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/8791
Collection自适应光学技术研究室(八室)
Affiliation1.Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu; 610209, China;
2.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China;
3.University of the Chinese Academy of Sciences, Beijing; 100049, China
Recommended Citation
GB/T 7714
Luan, Yinsen,Xu, Bing,Yang, Ping,et al. Optic flaws detection and location based on a plenoptic camera[J]. Chinese Optics Letters,2017,15(4):041102.
APA Luan, Yinsen,Xu, Bing,Yang, Ping,&Tang, Guomao.(2017).Optic flaws detection and location based on a plenoptic camera.Chinese Optics Letters,15(4),041102.
MLA Luan, Yinsen,et al."Optic flaws detection and location based on a plenoptic camera".Chinese Optics Letters 15.4(2017):041102.
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