Scratch detection in metal surface by blasting using Gabor filters | |
Liu, Shuangchun1,2; Jing, Hongwei1 | |
Source Publication | Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
![]() |
Volume | 9686Pages:96860W |
2016 | |
Language | 英语 |
ISSN | 0277-786X |
DOI | 10.1117/12.2243220 |
Indexed By | SCI ; Ei |
WOS ID | WOS:000391495500030 |
Subtype | C |
Abstract | Sand blasting process can produce fine random concave and convex surfaces on the surface of the workpiece, which make the collected image background of the workpiece complex and the defects difficult to detect. Especially for the detection of low-contrast scratches, scratch depth is less than the depth of sand blasting surface. Common edge detection methods and threshold segmentation methods are difficult to effectively extract the scratch defect. According to the vertical characteristics of scratches direction in the spatial domain and the spatial-frequency domain, a method based on Gabor filter is proposed for the detection of scratch defect. Firstly, 36 Gabor filters with different directions are used to extract the directional feature of the image. Then, using the gray threshold method to segment the scratch regions in 36 different directions and merge the scratch regions. Finally, the morphological processing is used to remove the noise interference and connect the scratch regions which are not continuous. The experimental results show that the method is feasible and robust. Compared with the hysteresis threshold algorithm, the algorithm extracts the edge of the scratch without burr and has high precision. © 2016 SPIE. |
Keyword | Bandpass Filters Blasting Edge Detection Frequency Domain Analysis Image Processing Manufacture Materials Testing Morphology Optoelectronic Devices Surface Defects |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.ioe.ac.cn/handle/181551/8563 |
Collection | 质量处(质检中心) |
Affiliation | 1. Institute of Optics and Electronics, Chinese Academy of Sciences, P.O .Box 350, Chengdu 2.610209, China 3. University of Chinese Academy of Sciences, Beijing 4.100049, China |
Recommended Citation GB/T 7714 | Liu, Shuangchun,Jing, Hongwei. Scratch detection in metal surface by blasting using Gabor filters[J]. Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices,2016,9686:96860W. |
APA | Liu, Shuangchun,&Jing, Hongwei.(2016).Scratch detection in metal surface by blasting using Gabor filters.Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices,9686,96860W. |
MLA | Liu, Shuangchun,et al."Scratch detection in metal surface by blasting using Gabor filters".Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices 9686(2016):96860W. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
2016-2130.pdf(620KB) | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | View Application Full Text |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment