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A method on error analysis for large-aperture optical telescope control system
Su, Yanrui1,2,3; Wang, Qiang1,2; Yan, Fabao4; Liu, Xiang1,2; Huang, Yongmei1,2
2016
发表期刊Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
ISSN0277-786X
卷号9682页码:96820C
文章类型C
摘要For large-aperture optical telescope, compared with the performance of azimuth in the control system, arc second-level jitters exist in elevation under different speeds' working mode, especially low-speed working mode in the process of its acquisition, tracking and pointing. The jitters are closely related to the working speed of the elevation, resulting in the reduction of accuracy and low-speed stability of the telescope. By collecting a large number of measured data to the elevation, we do analysis on jitters in the time domain, frequency domain and space domain respectively. And the relation between jitter points and the leading speed of elevation and the corresponding space angle is concluded that the jitters perform as periodic disturbance in space domain and the period of the corresponding space angle of the jitter points is 79.1″ approximately. Then we did simulation, analysis and comparison to the influence of the disturbance sources, like PWM power level output disturbance, torque (acceleration) disturbance, speed feedback disturbance and position feedback disturbance on the elevation to find that the space periodic disturbance still exist in the elevation performance. It leads us to infer that the problems maybe exist in angle measurement unit. The telescope employs a 24-bit photoelectric encoder and we can calculate the encoder grating angular resolution as 79.1016'', which is as the corresponding angle value in the whole encoder system of one period of the subdivision signal. The value is approximately equal to the space frequency of the jitters. Therefore, the working elevation of the telescope is affected by subdivision errors and the period of the subdivision error is identical to the period of encoder grating angular. Through comprehensive consideration and mathematical analysis, that DC subdivision error of subdivision error sources causes the jitters is determined, which is verified in the practical engineering. The method that analyze error sources from time domain, frequency domain and space domain respectively has a very good role in guiding to find disturbance sources for large-aperture optical telescope. © 2016 SPIE.
关键词Control Systems Error Analysis Errors Feedback Frequency Domain Analysis Jitter Manufacture Metal Drawing Mirrors Optical Telescopes Optical Testing Speed Units Of Measurement
DOI10.1117/12.2241486
收录类别SCI ; Ei
语种英语
项目资助者Chinese Academy of Sciences, Institute of Optics and Electronics (IOE) ; The Chinese Optical Society (COS)
WOS记录号WOS:000387746500011
引用统计
文献类型期刊论文
条目标识符http://ir.ioe.ac.cn/handle/181551/8538
专题光电工程总体研究室(一室)
作者单位1. Institute of Optics and Electronics, Chinese Academy of Sciences, No.1 Guangdian Road, Chengdu
2.610209, China
3. Key Laboratory of Optical Engineering, Chinese Academy of Sciences, No.1 Guangdian Road, Chengdu
4.610209, China
5. University of Chinese Academy of Sciences, No.19A Yuquan Road, Beijing
6.PRC 100049, China
7. School of Geosciences and InfoPhysics, Central South University, No.932 South Lushan Road, Changsha
8.410012, China
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GB/T 7714
Su, Yanrui,Wang, Qiang,Yan, Fabao,et al. A method on error analysis for large-aperture optical telescope control system[J]. Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes,2016,9682:96820C.
APA Su, Yanrui,Wang, Qiang,Yan, Fabao,Liu, Xiang,&Huang, Yongmei.(2016).A method on error analysis for large-aperture optical telescope control system.Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes,9682,96820C.
MLA Su, Yanrui,et al."A method on error analysis for large-aperture optical telescope control system".Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes 9682(2016):96820C.
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