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Noise suppression performance of typical phase shifting algorithms
Zhu, Xiaoqiang1,2; Wu, Yong-Qian1; Liu, Fengwei1,2
2016
Source PublicationProceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment
ISSN0277-786X
Volume9684Pages:968443
SubtypeC
AbstractComparative simulations are designed to evaluate the noise suppression performance of three typical phase shifting algorithms under different testing environments. The results show that random phase shifting algorithm is robust under different level of noise and has higher testing accuracy than conventional normal steps phase shitting algorithm while it's computationally low. Guidelines are given to choose a proper PSI algorithm under a certain testing environment with noises. © 2016 SPIE.
KeywordManufacture Optical Testing Spurious Signal Noise
DOI10.1117/12.2243231
Indexed BySCI ; Ei
Language英语
Funding OrganizationChinese Academy of Sciences, Institute of Optics and Electronics (IOE) ; The Chinese Optical Society (COS)
WOS IDWOS:000387429500147
Citation statistics
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/8530
Collection先光中心
Affiliation1. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu
2.610209, China
3. University of Chinese Academy of Sciences, Beijing
4.100049, China
Recommended Citation
GB/T 7714
Zhu, Xiaoqiang,Wu, Yong-Qian,Liu, Fengwei. Noise suppression performance of typical phase shifting algorithms[J]. Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment,2016,9684:968443.
APA Zhu, Xiaoqiang,Wu, Yong-Qian,&Liu, Fengwei.(2016).Noise suppression performance of typical phase shifting algorithms.Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment,9684,968443.
MLA Zhu, Xiaoqiang,et al."Noise suppression performance of typical phase shifting algorithms".Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment 9684(2016):968443.
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