| Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope | |
| Huang, Shihong1; Zhu, Tao1; Cao, Zhenzhou2; Liu, Min1; Deng, Ming1; Liu, Jianguo3; Li, Xiong4 | |
| 2016 | |
| 发表期刊 | IEEE Photonics Technology Letters
 |
| ISSN | 1041-1135 |
| 卷号 | 28期号:7页码:759-762 |
| 文章类型 | J |
| 摘要 | We present an amplitude difference comparison of coherent envelope method for accurately measuring the laser linewidth. The new method of comparing the contrast difference of the second peak and trough of coherent envelope to determine the laser linewidth is proved to be stable and has little error. The feasibility and the accuracy of the method have been confirmed theoretically and experimentally. Our method based on short delayed self-heterodyne interferometer can almost ignore the influence of the broadening spectrum induced by the 1/f frequency noise. Therefore, the method has the advantage of accurate detection for narrow or ultra-narrow linewidth. © 2016 IEEE. |
| 关键词 | Heterodyning Interferometers |
| DOI | 10.1109/LPT.2015.2513098 |
| 收录类别 | Ei |
| 语种 | 英语 |
| 引用统计 | |
| 文献类型 | 期刊论文 |
| 条目标识符 | http://ir.ioe.ac.cn/handle/181551/8472 |
| 专题 | 微细加工光学技术国家重点实验室（开放室） |
| 作者单位 | 1. Key Laboratory of Optoelectronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing, China 2. College of Electronics and Information, South-Central University for Nationalities, Wuhan, China 3. State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China 4. State Key Laboratory of Optical Technologies on Micro-Engineering and Nano-Fabrication, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China |
| 推荐引用方式 GB/T 7714 | Huang, Shihong,Zhu, Tao,Cao, Zhenzhou,et al. Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope[J]. IEEE Photonics Technology Letters,2016,28(7):759-762. |
| APA | Huang, Shihong.,Zhu, Tao.,Cao, Zhenzhou.,Liu, Min.,Deng, Ming.,...&Li, Xiong.(2016).Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope.IEEE Photonics Technology Letters,28(7),759-762. |
| MLA | Huang, Shihong,et al."Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope".IEEE Photonics Technology Letters 28.7(2016):759-762. |
| 条目包含的文件 | ||||||
| 文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
| 2016-2044.pdf（5443KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | 请求全文 | |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论