| Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope | |
| Huang, Shihong1; Zhu, Tao1; Cao, Zhenzhou2; Liu, Min1; Deng, Ming1; Liu, Jianguo3; Li, Xiong4 | |
| Source Publication | IEEE Photonics Technology Letters
 |
| Volume | 28Issue:7Pages:759-762 |
| 2016 | |
| Language | 英语 |
| ISSN | 1041-1135 |
| DOI | 10.1109/LPT.2015.2513098 |
| Indexed By | Ei |
| Subtype | J |
| Abstract | We present an amplitude difference comparison of coherent envelope method for accurately measuring the laser linewidth. The new method of comparing the contrast difference of the second peak and trough of coherent envelope to determine the laser linewidth is proved to be stable and has little error. The feasibility and the accuracy of the method have been confirmed theoretically and experimentally. Our method based on short delayed self-heterodyne interferometer can almost ignore the influence of the broadening spectrum induced by the 1/f frequency noise. Therefore, the method has the advantage of accurate detection for narrow or ultra-narrow linewidth. © 2016 IEEE. |
| Keyword | Heterodyning Interferometers |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.ioe.ac.cn/handle/181551/8472 |
| Collection | 微细加工光学技术国家重点实验室（开放室） |
| Affiliation | 1. Key Laboratory of Optoelectronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing, China 2. College of Electronics and Information, South-Central University for Nationalities, Wuhan, China 3. State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China 4. State Key Laboratory of Optical Technologies on Micro-Engineering and Nano-Fabrication, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China |
| Recommended Citation GB/T 7714 | Huang, Shihong,Zhu, Tao,Cao, Zhenzhou,et al. Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope[J]. IEEE Photonics Technology Letters,2016,28(7):759-762. |
| APA | Huang, Shihong.,Zhu, Tao.,Cao, Zhenzhou.,Liu, Min.,Deng, Ming.,...&Li, Xiong.(2016).Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope.IEEE Photonics Technology Letters,28(7),759-762. |
| MLA | Huang, Shihong,et al."Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope".IEEE Photonics Technology Letters 28.7(2016):759-762. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 2016-2044.pdf（5443KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | Application Full Text | |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment