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超高精度面形干涉检测技术进展 期刊论文
光电工程, 2020, 卷号: 47, 期号: 8, 页码: 18-30
Authors:  侯溪;  张帅;  胡小川;  全海洋;  吴高峰;  贾辛;  何一苇;  陈强;  伍凡
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先进光学制造  超精密光学  光学测量  面形检测  干涉检测  绝对检测  
K-B镜面形高精度检测技术研究进展 期刊论文
中国光学, 2020, 卷号: 13, 期号: 4, 页码: 660-675
Authors:  张帅;  侯溪
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X射线光学  K-B镜  光学测量  面形检测  拼接干涉  
NA1.35投影光刻光学系统偏振像差的优化 期刊论文
应用光学, 2019, 卷号: 40, 期号: 4, 页码: 575-582
Authors:  李杰[1,2];  林妩媚[1];  廖志杰[1]
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光学设计  偏振像差  薄膜光学  Jones光瞳  成像对比度  
Absolute interferometric testing of an ultra-precise flat substrate with a liquid mirror 会议论文
Proceedings of SPIE 11032 - EUV and X-ray Optics: Synergy between Laboratory and Space VI, Prague, Czech republic, April 3, 2019 - April 4, 2019
Authors:  Quan, Haiyang;  Hou, Xi;  Wu, Gaofeng;  Hu, Xiaochuan
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interferometry  absolute test  x-ray mirror  flatness  
Wavefront-aberration measurement and systematic-error analysis of a high numerical-aperture objective 期刊论文
Optical Engineering, 2018, 卷号: 57, 期号: 2, 页码: 024107
Authors:  Liu, Zhixiang;  Xing, Tingwen;  Jiang, Yadong;  Lv, Baobin
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Diffraction  Diffraction gratings  Interferometers  Ray tracing  Shearing  Systematic errors  Wavefronts  
Design of large zoom ratio long-wave infrared zoom system with compound zoom method 期刊论文
Optical Engineering, 2018, 卷号: 57, 期号: 2, 页码: 025104
Authors:  Chao, Cao;  Zhiyuan, Liao;  Yu, Bai;  Tingwen, Xing
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Differential equations  Infrared devices  Infrared radiation  
Model-free optical surface reconstruction from deflectometry data 会议论文
Proceedings of SPIE - OPTICAL MANUFACTURING AND TESTING XII, San Diego, CASan Diego, CA, AUG 20-22, 2018AUG 20-22, 2018
Authors:  Graves, L.R.;  Choi, H.;  Zhao, W.;  Oh, C.J.;  Su, P.;  Su, T.;  Kim, D.W.
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Deflectometry  model-free  metrology  freeform  
超高精度光学元件面形干涉检测技术及应用 期刊论文
《第十七届全国光学测试学术交流会摘要集》, 2018, 页码: 1
Authors:  侯溪;  宋伟红;  吴高峰;  贾辛;  全海洋;  徐富超
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光学元件  干涉检测  
Etching hard brittle optical materials by masked ion beam 会议论文
0277-786X
Authors:  Li, Yun;  Fu, Taotao;  Jia, Xin;  Xing, Tingwen
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Brittleness - Ions - Masks - Surface roughness  
Large-scale absolute surface reconstruction 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96843L
Authors:  Wu, Gao-Feng;  Quan, Hai-Yang;  Song, Wei-Hong;  Wu, Yong-Qian
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Image Resolution  Interferometry  Inverse Problems  Iterative Methods  Manufacture  Optical Testing  Pixels