IOE OpenIR  > 超精总体部
Browse Items

Browse/Search Results:  1-10 of 25 Help

Selected(0)Clear Items/Page:    Sort:
超高精度面形干涉检测技术进展 期刊论文
光电工程, 2020, 卷号: 47, 期号: 8, 页码: 18-30
Authors:  侯溪;  张帅;  胡小川;  全海洋;  吴高峰;  贾辛;  何一苇;  陈强;  伍凡
Adobe PDF(2279Kb)  |  Favorite  |  View/Download:33/0  |  Submit date:2021/05/11
先进光学制造  超精密光学  光学测量  面形检测  干涉检测  绝对检测  
K-B镜面形高精度检测技术研究进展 期刊论文
中国光学, 2020, 卷号: 13, 期号: 4, 页码: 660-675
Authors:  张帅;  侯溪
Adobe PDF(8014Kb)  |  Favorite  |  View/Download:33/0  |  Submit date:2021/05/11
X射线光学  K-B镜  光学测量  面形检测  拼接干涉  
NA1.35投影光刻光学系统偏振像差的优化 期刊论文
应用光学, 2019, 卷号: 40, 期号: 4, 页码: 575-582
Authors:  李杰[1,2];  林妩媚[1];  廖志杰[1]
Adobe PDF(1780Kb)  |  Favorite  |  View/Download:48/0  |  Submit date:2021/05/06
光学设计  偏振像差  薄膜光学  Jones光瞳  成像对比度  
Absolute interferometric testing of an ultra-precise flat substrate with a liquid mirror 会议论文
Proceedings of SPIE 11032 - EUV and X-ray Optics: Synergy between Laboratory and Space VI, Prague, Czech republic, April 3, 2019 - April 4, 2019
Authors:  Quan, Haiyang;  Hou, Xi;  Wu, Gaofeng;  Hu, Xiaochuan
Adobe PDF(914Kb)  |  Favorite  |  View/Download:34/0  |  Submit date:2021/05/06
interferometry  absolute test  x-ray mirror  flatness  
Wavefront-aberration measurement and systematic-error analysis of a high numerical-aperture objective 期刊论文
Optical Engineering, 2018, 卷号: 57, 期号: 2, 页码: 024107
Authors:  Liu, Zhixiang;  Xing, Tingwen;  Jiang, Yadong;  Lv, Baobin
Adobe PDF(3060Kb)  |  Favorite  |  View/Download:103/0  |  Submit date:2019/08/23
Diffraction  Diffraction gratings  Interferometers  Ray tracing  Shearing  Systematic errors  Wavefronts  
Design of large zoom ratio long-wave infrared zoom system with compound zoom method 期刊论文
Optical Engineering, 2018, 卷号: 57, 期号: 2, 页码: 025104
Authors:  Chao, Cao;  Zhiyuan, Liao;  Yu, Bai;  Tingwen, Xing
Adobe PDF(2121Kb)  |  Favorite  |  View/Download:86/0  |  Submit date:2019/08/23
Differential equations  Infrared devices  Infrared radiation  
Model-free optical surface reconstruction from deflectometry data 会议论文
Proceedings of SPIE - OPTICAL MANUFACTURING AND TESTING XII, San Diego, CASan Diego, CA, AUG 20-22, 2018AUG 20-22, 2018
Authors:  Graves, L.R.;  Choi, H.;  Zhao, W.;  Oh, C.J.;  Su, P.;  Su, T.;  Kim, D.W.
Adobe PDF(699Kb)  |  Favorite  |  View/Download:103/0  |  Submit date:2019/08/23
Deflectometry  model-free  metrology  freeform  
超高精度光学元件面形干涉检测技术及应用 期刊论文
《第十七届全国光学测试学术交流会摘要集》, 2018, 页码: 1
Authors:  侯溪;  宋伟红;  吴高峰;  贾辛;  全海洋;  徐富超
Adobe PDF(213Kb)  |  Favorite  |  View/Download:108/2  |  Submit date:2019/08/23
光学元件  干涉检测  
Etching hard brittle optical materials by masked ion beam 会议论文
Authors:  Li, Yun;  Fu, Taotao;  Jia, Xin;  Xing, Tingwen
Adobe PDF(339Kb)  |  Favorite  |  View/Download:106/0  |  Submit date:2018/12/20
Brittleness - Ions - Masks - Surface roughness  
Large-scale absolute surface reconstruction 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96843L
Authors:  Wu, Gao-Feng;  Quan, Hai-Yang;  Song, Wei-Hong;  Wu, Yong-Qian
Adobe PDF(601Kb)  |  Favorite  |  View/Download:120/0  |  Submit date:2018/06/14
Image Resolution  Interferometry  Inverse Problems  Iterative Methods  Manufacture  Optical Testing  Pixels