IOE OpenIR  > 质量处(质检中心)
Development of a parallelism tester for visible and infrared compound system
Jing HongwEi; Wu Shibin; Chen Qiang; LEi Boping; Jiang Jibin; MEi Ke
Volume7283
2009
Language英语
Indexed ByEi
Subtype会议论文
AbstractA parallelism tester is developed to measure the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester is composed of visible system, infrared system, cassegrain autocollimator, imaging and data processing system and 5D workshop. The visible system generates visible light. The infrared system generates the infrared light. The visible light and infrared light are auto-collimated by the Cassegrain auto-collimator. During measurement the autocollimated light is directed into the optical path of the compound system bEing tested ,which passes through the compound system bEing tested and back to the tester. The visible light is used for targetting and infrared light is used for measurement. An 5D workshop is used for adjustment. The imaging and data processing system detects the deviation of infrared light spots and calculate the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester can be used to measure the parallelism of visible optical axis and infrared optical axis of visible and infrared compound system. The calibrated accuracy of the tester is 3 arc second.; A parallelism tester is developed to measure the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester is composed of visible system, infrared system, cassegrain autocollimator, imaging and data processing system and 5D workshop. The visible system generates visible light. The infrared system generates the infrared light. The visible light and infrared light are auto-collimated by the Cassegrain auto-collimator. During measurement the autocollimated light is directed into the optical path of the compound system bEing tested ,which passes through the compound system bEing tested and back to the tester. The visible light is used for targetting and infrared light is used for measurement. An 5D workshop is used for adjustment. The imaging and data processing system detects the deviation of infrared light spots and calculate the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester can be used to measure the parallelism of visible optical axis and infrared optical axis of visible and infrared compound system. The calibrated accuracy of the tester is 3 arc second.
Conference NameProceedings of SPIE
Conference Date2009
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7930
Collection质量处(质检中心)
Corresponding AuthorJing HongwEi
Affiliation中国科学院光电技术研究所
Recommended Citation
GB/T 7714
Jing HongwEi,Wu Shibin,Chen Qiang,et al. Development of a parallelism tester for visible and infrared compound system[C],2009.
Files in This Item:
File Name/Size DocType Version Access License
2009-278.pdf(311KB)会议论文 开放获取CC BY-NC-SAApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Jing HongwEi]'s Articles
[Wu Shibin]'s Articles
[Chen Qiang]'s Articles
Baidu academic
Similar articles in Baidu academic
[Jing HongwEi]'s Articles
[Wu Shibin]'s Articles
[Chen Qiang]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Jing HongwEi]'s Articles
[Wu Shibin]'s Articles
[Chen Qiang]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.