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题名:
Development of a parallelism tester for visible and infrared compound system
作者: Jing HongwEi; Wu Shibin; Chen Qiang; LEi Boping; Jiang Jibin; MEi Ke
出版日期: 2009
会议名称: Proceedings of SPIE
会议日期: 2009
通讯作者: Jing HongwEi
中文摘要: A parallelism tester is developed to measure the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester is composed of visible system, infrared system, cassegrain autocollimator, imaging and data processing system and 5D workshop. The visible system generates visible light. The infrared system generates the infrared light. The visible light and infrared light are auto-collimated by the Cassegrain auto-collimator. During measurement the autocollimated light is directed into the optical path of the compound system bEing tested ,which passes through the compound system bEing tested and back to the tester. The visible light is used for targetting and infrared light is used for measurement. An 5D workshop is used for adjustment. The imaging and data processing system detects the deviation of infrared light spots and calculate the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester can be used to measure the parallelism of visible optical axis and infrared optical axis of visible and infrared compound system. The calibrated accuracy of the tester is 3 arc second.
英文摘要: A parallelism tester is developed to measure the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester is composed of visible system, infrared system, cassegrain autocollimator, imaging and data processing system and 5D workshop. The visible system generates visible light. The infrared system generates the infrared light. The visible light and infrared light are auto-collimated by the Cassegrain auto-collimator. During measurement the autocollimated light is directed into the optical path of the compound system bEing tested ,which passes through the compound system bEing tested and back to the tester. The visible light is used for targetting and infrared light is used for measurement. An 5D workshop is used for adjustment. The imaging and data processing system detects the deviation of infrared light spots and calculate the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester can be used to measure the parallelism of visible optical axis and infrared optical axis of visible and infrared compound system. The calibrated accuracy of the tester is 3 arc second.
收录类别: Ei
语种: 英语
卷号: 7283
文章类型: 会议论文
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7930
Appears in Collections:质量处(质检中心)_会议论文

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作者单位: 中国科学院光电技术研究所

Recommended Citation:
Jing HongwEi,Wu Shibin,Chen Qiang,et al. Development of a parallelism tester for visible and infrared compound system[C]. 见:Proceedings of SPIE. 2009.
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文件名: 2009-278.pdf
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