中国科学院光电技术研究所机构知识库
Advanced  
IOE OpenIR  > 质量处(质检中心)  > 会议论文
题名:
Sub-aperture Stitching with Scanning Pentaprism Testing Optical Wave-front
作者: Wang Lihua; Yang Wei; Li Lei; Wu Shibin; Lin Zhaohen
出版日期: 2010
会议名称: Proceedings of the SPIE - The International Society for Optical Engineering
会议日期: 2010
通讯作者: Wang Lihua
中文摘要: This paper describes a pentaprism scanning combined with sub-aperture stitching interference method to test large aperture optical system wave-front. This method uses pentaprism scanning and interferometer testing sub-aperture optical system wave-front, after testing all the sub-aperture wave-front and then using average error stitching algorithm to reconstruction full-aperture optical system wave-front. It makes use of the pentaprism easily to adjust and interferometer's high-precision characteristic. Analyzed the mechanical precision of turntable and electric guide, when the turntable sway angle is less than 8', location accuracy is less than 1.194' and the electric guide linearity is less than 8' location accuracy is less than 83.3 mu m, can meet the testing requirements. We used 40mm sub-aperture testing 312mm full aperture wave-front PV is 0.2197 lambda and RMS is 0.0536 lambda . Compared the stitching results with Zygo interferometer directly full aperture testing verified the accuracy of the method and provides a new idea for testing a large aperture optical wave-front.
英文摘要: This paper describes a pentaprism scanning combined with sub-aperture stitching interference method to test large aperture optical system wave-front. This method uses pentaprism scanning and interferometer testing sub-aperture optical system wave-front, after testing all the sub-aperture wave-front and then using average error stitching algorithm to reconstruction full-aperture optical system wave-front. It makes use of the pentaprism easily to adjust and interferometer's high-precision characteristic. Analyzed the mechanical precision of turntable and electric guide, when the turntable sway angle is less than 8', location accuracy is less than 1.194' and the electric guide linearity is less than 8' location accuracy is less than 83.3 mu m, can meet the testing requirements. We used 40mm sub-aperture testing 312mm full aperture wave-front PV is 0.2197 lambda and RMS is 0.0536 lambda . Compared the stitching results with Zygo interferometer directly full aperture testing verified the accuracy of the method and provides a new idea for testing a large aperture optical wave-front.
收录类别: Ei ; ISTP
语种: 英语
卷号: 7654
文章类型: 会议论文
页码: 76540Y (5 pp.)
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7912
Appears in Collections:质量处(质检中心)_会议论文

Files in This Item:

There are no files associated with this item.


作者单位: 中国科学院光电技术研究所

Recommended Citation:
Wang Lihua,Yang Wei,Li Lei,et al. Sub-aperture Stitching with Scanning Pentaprism Testing Optical Wave-front[C]. 见:Proceedings of the SPIE - The International Society for Optical Engineering. 2010.
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[Wang Lihua]'s Articles
[Yang Wei]'s Articles
[Li Lei]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[Wang Lihua]‘s Articles
[Yang Wei]‘s Articles
[Li Lei]‘s Articles
Related Copyright Policies
Null
Social Bookmarking
Add to CiteULike Add to Connotea Add to Del.icio.us Add to Digg Add to Reddit
所有评论 (0)
暂无评论
 
评注功能仅针对注册用户开放,请您登录
您对该条目有什么异议,请填写以下表单,管理员会尽快联系您。
内 容:
Email:  *
单位:
验证码:   刷新
您在IR的使用过程中有什么好的想法或者建议可以反馈给我们。
标 题:
 *
内 容:
Email:  *
验证码:   刷新

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.

 

 

Valid XHTML 1.0!
Copyright © 2007-2016  中国科学院光电技术研究所 - Feedback
Powered by CSpace