IOE OpenIR  > 薄膜光学技术研究室(十一室)
Investigation of laser-induced damage threshold of hafnia/silica high reflectors at 1064 nm
Ai, Wanjun1,2; Xiong, Shengming1; Ai, W. (awj422177370@163.com)
Volume8206
Pages82060G
2012
Language英语
ISSN0277786X
DOI10.1117/12.910464
Indexed ByEi
Subtype会议论文
AbstractHfO2 single layers and HfO2/SiO2 high reflectors with standard 1/4 wavelength design were prepared by ion assisted deposition (IAD) with APS ion source and ion beam sputtering (IBS). Characterization of HfO2 single layers such as structural and optical properties, surface topography and absorption have been studied. The laser-induced damage thresholds (LIDTs) of the high reflectors with different multilayer stacks at 1064nm were tested with S-on-1 testing mode according to ISO-11254. In addition, optical properties, surface topography and absorption of these testing high reflectors have also been investigated in our experiments. All the results used to analyze the LIDTs of high reflectors have been discussed and interpreted in literature. © 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).; HfO2 single layers and HfO2/SiO2 high reflectors with standard 1/4 wavelength design were prepared by ion assisted deposition (IAD) with APS ion source and ion beam sputtering (IBS). Characterization of HfO2 single layers such as structural and optical properties, surface topography and absorption have been studied. The laser-induced damage thresholds (LIDTs) of the high reflectors with different multilayer stacks at 1064nm were tested with S-on-1 testing mode according to ISO-11254. In addition, optical properties, surface topography and absorption of these testing high reflectors have also been investigated in our experiments. All the results used to analyze the LIDTs of high reflectors have been discussed and interpreted in literature. © 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).
Conference NameProceedings of SPIE: Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers
Conference Date2012
Citation statistics
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7858
Collection薄膜光学技术研究室(十一室)
Corresponding AuthorAi, W. (awj422177370@163.com)
Affiliation1. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
2. Graduate School of the Chinese Academy of Sciences, Beijing 100039, China
Recommended Citation
GB/T 7714
Ai, Wanjun,Xiong, Shengming,Ai, W. . Investigation of laser-induced damage threshold of hafnia/silica high reflectors at 1064 nm[C],2012:82060G.
Files in This Item:
File Name/Size DocType Version Access License
2012-2173.pdf(354KB)会议论文 开放获取CC BY-NC-SAApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Ai, Wanjun]'s Articles
[Xiong, Shengming]'s Articles
[Ai, W. (awj422177370@163.com)]'s Articles
Baidu academic
Similar articles in Baidu academic
[Ai, Wanjun]'s Articles
[Xiong, Shengming]'s Articles
[Ai, W. (awj422177370@163.com)]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Ai, Wanjun]'s Articles
[Xiong, Shengming]'s Articles
[Ai, W. (awj422177370@163.com)]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.