| 题名: | High-sensitivity testing techniques for laser optics |
| 作者: | Li B.; Qu Z.; Wang Y.; Han Y.; Gao W.
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| 出版日期: | 2011
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| 会议名称: | Proceedings of SPIE - The International Society for Optical Engineering, v 7995, 2011, Seventh International Conference on Thin Film Physics and Applications
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| 会议日期: | 2011
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| 通讯作者: | Li B.
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| 中文摘要: | The absorptance and high reflectance measurements of laser optics are presented. In the absorptance measurement, the laser calorimetry (LC) technique is investigated. A rigorous theoretical model describing the laser irradiation induced temperature rise in a coated sample, in which both the finite thermal conductivity and the finite size of sample are taken into account, is developed to optimize the temperature detection geometry to further improve the accuracy of the absorptance measurement. For the high reflectivity measurement, an optical feedback cavity ring-down (OF-CRD) technique, in which a continuous-wave (CW) Fabry-Perot (FP) diode laser is used as the light source, is employed for high reflectivity measurement. The linear and V-shaped schemes are investigated to measure the reflectivity of cavity mirrors and planar test mirrors, respectively. For cavity mirrors with reflectance larger than 99.99%, the measurement error is less than 1ppm. |
| 英文摘要: | The absorptance and high reflectance measurements of laser optics are presented. In the absorptance measurement, the laser calorimetry (LC) technique is investigated. A rigorous theoretical model describing the laser irradiation induced temperature rise in a coated sample, in which both the finite thermal conductivity and the finite size of sample are taken into account, is developed to optimize the temperature detection geometry to further improve the accuracy of the absorptance measurement. For the high reflectivity measurement, an optical feedback cavity ring-down (OF-CRD) technique, in which a continuous-wave (CW) Fabry-Perot (FP) diode laser is used as the light source, is employed for high reflectivity measurement. The linear and V-shaped schemes are investigated to measure the reflectivity of cavity mirrors and planar test mirrors, respectively. For cavity mirrors with reflectance larger than 99.99%, the measurement error is less than 1ppm. |
| 收录类别: | Ei
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| 语种: | 英语
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| 卷号: | 7995
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| 文章类型: | 会议论文
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| 内容类型: | 会议论文
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| URI标识: | http://ir.ioe.ac.cn/handle/181551/7850
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| Appears in Collections: | 薄膜光学技术研究室（十一室）_会议论文
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| 2011-11-006.pdf（327KB） | 会议论文 | -- | 限制开放 | | View
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| Recommended Citation: | |
Li B.,Qu Z.,Wang Y.,et al. High-sensitivity testing techniques for laser optics[C]. 见:Proceedings of SPIE - The International Society for Optical Engineering, v 7995, 2011, Seventh International Conference on Thin Film Physics and Applications. 2011.
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