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题名:
Potential applications of photothermal interferometric detection technique in the single-layer optical thin film system
作者: Honggang Hao; Jianwen Fang; Xiangming Liu
出版日期: 2010
会议名称: Proceedings of the SPIE - The International Society for Optical Engineering
会议日期: 2010
通讯作者: Honggang Hao
中文摘要: The sensitive photothermal interferometric detection technique, in which an interference fringe pattern formed by overlapping two reflected probe beams from the front and rear surfaces of the sample with two interfaces was used to measure the photothermal signal, and its application for characterization of transparent (or partially transparent) plate samples had been theoretically and experimentally investigated in detail. Theoretical and experimental results demonstrated the proposed photothermal interferometric detection technique to be a sensitive photothermal method for the study of the thermophysical properties of transparent samples. Can this method be applied to the field of single-layer optical thin film system? We all know that a single-layer optical thin film is usually deposited on a substrate and has three interfaces. In this paper, based on the transmission theory of Gauss-beam, the interference effect of the reflection beams from a single layer film-substrate is studied. A theory is developed to describe the intensity profile of the interference fringe and the corresponded modulated photothermal interferometric signal. An experiment is performed with a ZnS-BK7 glass single-layer sample to measure the intensity distribution of the interference fringe pattern and the photothermal signal with CW laser excitation. Agreement is obtained between the theoretical predictions and experimental results. It shows the photothermal interferometric detection technique can be used to study the thermophysical properties of the single-layer optical thin film system.
英文摘要: The sensitive photothermal interferometric detection technique, in which an interference fringe pattern formed by overlapping two reflected probe beams from the front and rear surfaces of the sample with two interfaces was used to measure the photothermal signal, and its application for characterization of transparent (or partially transparent) plate samples had been theoretically and experimentally investigated in detail. Theoretical and experimental results demonstrated the proposed photothermal interferometric detection technique to be a sensitive photothermal method for the study of the thermophysical properties of transparent samples. Can this method be applied to the field of single-layer optical thin film system? We all know that a single-layer optical thin film is usually deposited on a substrate and has three interfaces. In this paper, based on the transmission theory of Gauss-beam, the interference effect of the reflection beams from a single layer film-substrate is studied. A theory is developed to describe the intensity profile of the interference fringe and the corresponded modulated photothermal interferometric signal. An experiment is performed with a ZnS-BK7 glass single-layer sample to measure the intensity distribution of the interference fringe pattern and the photothermal signal with CW laser excitation. Agreement is obtained between the theoretical predictions and experimental results. It shows the photothermal interferometric detection technique can be used to study the thermophysical properties of the single-layer optical thin film system.
语种: 英语
卷号: 7656
文章类型: 会议论文
页码: 76561Z (8 pp.)
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7846
Appears in Collections:薄膜光学技术研究室(十一室)_会议论文

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作者单位: 中国科学院光电技术研究所

Recommended Citation:
Honggang Hao,Jianwen Fang,Xiangming Liu. Potential applications of photothermal interferometric detection technique in the single-layer optical thin film system[C]. 见:Proceedings of the SPIE - The International Society for Optical Engineering. 2010.
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