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题名:
Effect of threshold value on high reflectivity measurement with optical feedback cavity ring-down technique
作者: Gonga Yuan; Hana Yanling; Li Bincheng
出版日期: 2009
会议名称: Proceedings of SPIE
会议日期: 2009
通讯作者: Gonga Yuan
中文摘要: The influence of a predefined threshold value on high reflectivity measurement in an optical feedback cavity ring-down technique (OF-CRD) is investigated. The strong optical feedback from the front cavity mirror of a linear ring-down cavity is re-injected into the oscillator cavity of the diode laser and causes line-width reduction of diode laser. The narrowed laser line is occasionally in resonance with one or more ring-down cavity modes and large resonant peaks are observed in the ring-down cavity output signals. The diode laser is switched off at the negative step of the square-wave modulation signal. If the amplitude at the negative step exceeds the pre-defined threshold value, an exponential decay signal is recorded to fit the cavity decay time. The reflectivity of the cavity mirror is determined statistically to be 99.9907±0.0002% and 99.9899±0.0004% with threshold values of 350mV and 50mV, respectively. All reflectivities measured at six cavity lengths with a higher threshold are more precise than that measured with the lower threshold. A method to determine the threshold value is proposed for accurate high reflectivity measurement.
英文摘要: The influence of a predefined threshold value on high reflectivity measurement in an optical feedback cavity ring-down technique (OF-CRD) is investigated. The strong optical feedback from the front cavity mirror of a linear ring-down cavity is re-injected into the oscillator cavity of the diode laser and causes line-width reduction of diode laser. The narrowed laser line is occasionally in resonance with one or more ring-down cavity modes and large resonant peaks are observed in the ring-down cavity output signals. The diode laser is switched off at the negative step of the square-wave modulation signal. If the amplitude at the negative step exceeds the pre-defined threshold value, an exponential decay signal is recorded to fit the cavity decay time. The reflectivity of the cavity mirror is determined statistically to be 99.9907±0.0002% and 99.9899±0.0004% with threshold values of 350mV and 50mV, respectively. All reflectivities measured at six cavity lengths with a higher threshold are more precise than that measured with the lower threshold. A method to determine the threshold value is proposed for accurate high reflectivity measurement.
收录类别: Ei
语种: 英语
卷号: 7383
文章类型: 会议论文
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7843
Appears in Collections:薄膜光学技术研究室(十一室)_会议论文

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作者单位: 中国科学院光电技术研究所

Recommended Citation:
Gonga Yuan,Hana Yanling,Li Bincheng. Effect of threshold value on high reflectivity measurement with optical feedback cavity ring-down technique[C]. 见:Proceedings of SPIE. 2009.
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