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 Analysis to the measurement error on the index homogeneity of optical material Liao, Zhiyuan1,2; Xing, Tingwen1; Liu, Zhixiang1; Liao, Z. Volume 8417 Pages 84173G 2012 Language 英语 ISSN 0277786X DOI 10.1117/12.975921 Indexed By Ei Subtype 会议论文 Abstract In order to get three-dimensional distribution of the optical material which has very high index homogeneity, measuring index homogeneity of the main direction of a sample, then opening a rectangle window in the sample to measure the index homogeneity of the window direction. Zernike circle polynomials are in widespread use for wavefront analysis because of their orthogonality over a circular pupil and their representation of balanced classical aberrations, for the main direction is circular, we use the Zernike circle polynomials to fit the main direction interferometric data. From result of fitting the main direction interferometric data, we find the measuring error which must be taken into account. So it is an important question how to choose the orthonormal polynomial for fitting the window direction interferometric data. Using the Zernike circle polynomials as the basis functions, the orthonormal polynomials of the rectangular pupil be obtained from the circle polynomials by the Gram-Schmidt orthogonalization process, using the first fifteen items of the orthonormal polynomials of the rectangular pupil fit the interferometric data of the window direction, we get a good fitting precision, find the measuring error of some samples considerable at the same. © 2012 SPIE.; In order to get three-dimensional distribution of the optical material which has very high index homogeneity, measuring index homogeneity of the main direction of a sample, then opening a rectangle window in the sample to measure the index homogeneity of the window direction. Zernike circle polynomials are in widespread use for wavefront analysis because of their orthogonality over a circular pupil and their representation of balanced classical aberrations, for the main direction is circular, we use the Zernike circle polynomials to fit the main direction interferometric data. From result of fitting the main direction interferometric data, we find the measuring error which must be taken into account. So it is an important question how to choose the orthonormal polynomial for fitting the window direction interferometric data. Using the Zernike circle polynomials as the basis functions, the orthonormal polynomials of the rectangular pupil be obtained from the circle polynomials by the Gram-Schmidt orthogonalization process, using the first fifteen items of the orthonormal polynomials of the rectangular pupil fit the interferometric data of the window direction, we get a good fitting precision, find the measuring error of some samples considerable at the same. © 2012 SPIE. Conference Name Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Conference Date 2012 Citation statistics Document Type 会议论文 Identifier http://ir.ioe.ac.cn/handle/181551/7784 Collection 自适应光学技术研究室（八室） Corresponding Author Liao, Z. Affiliation 1. Lab of Applied Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China2. Graduate School, Chinese Academy of Sciences, Beijing 100039, China Recommended CitationGB/T 7714 Liao, Zhiyuan,Xing, Tingwen,Liu, Zhixiang,et al. Analysis to the measurement error on the index homogeneity of optical material[C],2012:84173G.
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