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Error analysis of Gaussian spot width measured with CCD sensor
He, Yuanxing1,2,3; Li, Xinyang1,2; He, Y.
Volume8417
Pages841720
2012
Language英语
ISSN0277786X
DOI10.1117/12.970553
Indexed ByEi
Subtype会议论文
AbstractThe system errors and random errors of a CCD sensor cause measurement errors of a laser spot width. Taking the Gaussian spot as example, the computer simulation method is used to analyze the influences of the measurement window size, the non-ideal integral sampling, the number of quantization lever and the read-out noise on the measurement precision of Gaussian spot width respectively, and the synthesized influences of these four kinds of error sources of the laboratory 8-bit CCD sensor on the measurement precision of Gaussian spot width. An optimal measurement window size is given. Simulation results are analyzed and discussed. © 2012 SPIE.; The system errors and random errors of a CCD sensor cause measurement errors of a laser spot width. Taking the Gaussian spot as example, the computer simulation method is used to analyze the influences of the measurement window size, the non-ideal integral sampling, the number of quantization lever and the read-out noise on the measurement precision of Gaussian spot width respectively, and the synthesized influences of these four kinds of error sources of the laboratory 8-bit CCD sensor on the measurement precision of Gaussian spot width. An optimal measurement window size is given. Simulation results are analyzed and discussed. © 2012 SPIE.
Conference NameProceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Conference Date2012
Citation statistics
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7783
Collection自适应光学技术研究室(八室)
Corresponding AuthorHe, Y.
Affiliation1. Institute of Optics and Electronics, Chinese Academy of Science, Chengdu, Sichuan 610209, China
2. Key Laboratory on Adaptive Optics, Chinese Academy of Science, Chengdu 610209, China
3. College of Optoelectronic Science and Engineering, National University of Defense Technology, Changsha 410073, China
Recommended Citation
GB/T 7714
He, Yuanxing,Li, Xinyang,He, Y.. Error analysis of Gaussian spot width measured with CCD sensor[C],2012:841720.
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