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题名:
Error analysis of Gaussian spot width measured with CCD sensor
作者: He, Yuanxing1,2,3; Li, Xinyang1,2
出版日期: 2012
会议名称: Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
会议日期: 2012
DOI: 10.1117/12.970553
通讯作者: He, Y.
中文摘要: The system errors and random errors of a CCD sensor cause measurement errors of a laser spot width. Taking the Gaussian spot as example, the computer simulation method is used to analyze the influences of the measurement window size, the non-ideal integral sampling, the number of quantization lever and the read-out noise on the measurement precision of Gaussian spot width respectively, and the synthesized influences of these four kinds of error sources of the laboratory 8-bit CCD sensor on the measurement precision of Gaussian spot width. An optimal measurement window size is given. Simulation results are analyzed and discussed. © 2012 SPIE.
英文摘要: The system errors and random errors of a CCD sensor cause measurement errors of a laser spot width. Taking the Gaussian spot as example, the computer simulation method is used to analyze the influences of the measurement window size, the non-ideal integral sampling, the number of quantization lever and the read-out noise on the measurement precision of Gaussian spot width respectively, and the synthesized influences of these four kinds of error sources of the laboratory 8-bit CCD sensor on the measurement precision of Gaussian spot width. An optimal measurement window size is given. Simulation results are analyzed and discussed. © 2012 SPIE.
收录类别: Ei
语种: 英语
卷号: 8417
ISSN号: 0277786X
文章类型: 会议论文
页码: 841720
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7783
Appears in Collections:自适应光学技术研究室(八室)_会议论文

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作者单位: 1. Institute of Optics and Electronics, Chinese Academy of Science, Chengdu, Sichuan 610209, China
2. Key Laboratory on Adaptive Optics, Chinese Academy of Science, Chengdu 610209, China
3. College of Optoelectronic Science and Engineering, National University of Defense Technology, Changsha 410073, China

Recommended Citation:
He, Yuanxing,Li, Xinyang. Error analysis of Gaussian spot width measured with CCD sensor[C]. 见:Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. 2012.
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