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题名:
Improved color interpolation method based on bayer image
作者: Wang, Jin1,2
出版日期: 2012
会议名称: Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
会议日期: 2012
DOI: 10.1117/12.974306
通讯作者: Wang, J.
中文摘要: Image sensors are important components of lunar exploration device. Considering volume and cost, image sensors generally adopt a single CCD or CMOS at the present time, and the surface of the sensor is covered with a layer of color filter array(CFA), which is usually Bayer CFA. In the Bayer CFA, each pixel can only get one of tricolor, so it is necessary to carry out color interpolation in order to get the full color image. An improved Bayer image interpolation method is presented, which is novel, practical, and also easy to be realized. The results of experiments to prove the effect of the interpolation are shown. Comparing with classic methods, this method can find edge of image more accurately, reduce the saw tooth phenomenon in the edge area, and keep the image smooth in other area. This method is applied successfully in a certain exploration imaging system. © 2012 SPIE.
英文摘要: Image sensors are important components of lunar exploration device. Considering volume and cost, image sensors generally adopt a single CCD or CMOS at the present time, and the surface of the sensor is covered with a layer of color filter array(CFA), which is usually Bayer CFA. In the Bayer CFA, each pixel can only get one of tricolor, so it is necessary to carry out color interpolation in order to get the full color image. An improved Bayer image interpolation method is presented, which is novel, practical, and also easy to be realized. The results of experiments to prove the effect of the interpolation are shown. Comparing with classic methods, this method can find edge of image more accurately, reduce the saw tooth phenomenon in the edge area, and keep the image smooth in other area. This method is applied successfully in a certain exploration imaging system. © 2012 SPIE.
收录类别: Ei
语种: 英语
卷号: 8420
ISSN号: 0277786X
文章类型: 会议论文
页码: 84200Z
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7691
Appears in Collections:光电探测与信号处理研究室(五室)_会议论文

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作者单位: 1. Institute of Optics and Electronics, Chinese Academy of Engineering, Chengdu 610209, China
2. University of Electronic Science and Technology of China, School of Optoelectronic Information, Chengdu 610054, China

Recommended Citation:
Wang, Jin. Improved color interpolation method based on bayer image[C]. 见:Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing. 2012.
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