IOE OpenIR  > 光电探测与信号处理研究室(五室)
Improved color interpolation method based on bayer image
Wang, Jin1,2; Wang, J.
Volume8420
Pages84200Z
2012
Language英语
ISSN0277786X
DOI10.1117/12.974306
Indexed ByEi
Subtype会议论文
AbstractImage sensors are important components of lunar exploration device. Considering volume and cost, image sensors generally adopt a single CCD or CMOS at the present time, and the surface of the sensor is covered with a layer of color filter array(CFA), which is usually Bayer CFA. In the Bayer CFA, each pixel can only get one of tricolor, so it is necessary to carry out color interpolation in order to get the full color image. An improved Bayer image interpolation method is presented, which is novel, practical, and also easy to be realized. The results of experiments to prove the effect of the interpolation are shown. Comparing with classic methods, this method can find edge of image more accurately, reduce the saw tooth phenomenon in the edge area, and keep the image smooth in other area. This method is applied successfully in a certain exploration imaging system. © 2012 SPIE.; Image sensors are important components of lunar exploration device. Considering volume and cost, image sensors generally adopt a single CCD or CMOS at the present time, and the surface of the sensor is covered with a layer of color filter array(CFA), which is usually Bayer CFA. In the Bayer CFA, each pixel can only get one of tricolor, so it is necessary to carry out color interpolation in order to get the full color image. An improved Bayer image interpolation method is presented, which is novel, practical, and also easy to be realized. The results of experiments to prove the effect of the interpolation are shown. Comparing with classic methods, this method can find edge of image more accurately, reduce the saw tooth phenomenon in the edge area, and keep the image smooth in other area. This method is applied successfully in a certain exploration imaging system. © 2012 SPIE.
Conference NameProceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Conference Date2012
Citation statistics
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7691
Collection光电探测与信号处理研究室(五室)
Corresponding AuthorWang, J.
Affiliation1. Institute of Optics and Electronics, Chinese Academy of Engineering, Chengdu 610209, China
2. University of Electronic Science and Technology of China, School of Optoelectronic Information, Chengdu 610054, China
Recommended Citation
GB/T 7714
Wang, Jin,Wang, J.. Improved color interpolation method based on bayer image[C],2012:84200Z.
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