| Improved color interpolation method based on bayer image | |
| Wang, Jin1,2; Wang, J. | |
| Volume | 8420 |
| Pages | 84200Z |
| 2012 | |
| Language | 英语 |
| ISSN | 0277786X |
| DOI | 10.1117/12.974306 |
| Indexed By | Ei |
| Subtype | 会议论文 |
| Abstract | Image sensors are important components of lunar exploration device. Considering volume and cost, image sensors generally adopt a single CCD or CMOS at the present time, and the surface of the sensor is covered with a layer of color filter array(CFA), which is usually Bayer CFA. In the Bayer CFA, each pixel can only get one of tricolor, so it is necessary to carry out color interpolation in order to get the full color image. An improved Bayer image interpolation method is presented, which is novel, practical, and also easy to be realized. The results of experiments to prove the effect of the interpolation are shown. Comparing with classic methods, this method can find edge of image more accurately, reduce the saw tooth phenomenon in the edge area, and keep the image smooth in other area. This method is applied successfully in a certain exploration imaging system. © 2012 SPIE.; Image sensors are important components of lunar exploration device. Considering volume and cost, image sensors generally adopt a single CCD or CMOS at the present time, and the surface of the sensor is covered with a layer of color filter array(CFA), which is usually Bayer CFA. In the Bayer CFA, each pixel can only get one of tricolor, so it is necessary to carry out color interpolation in order to get the full color image. An improved Bayer image interpolation method is presented, which is novel, practical, and also easy to be realized. The results of experiments to prove the effect of the interpolation are shown. Comparing with classic methods, this method can find edge of image more accurately, reduce the saw tooth phenomenon in the edge area, and keep the image smooth in other area. This method is applied successfully in a certain exploration imaging system. © 2012 SPIE. |
| Conference Name | Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing |
| Conference Date | 2012 |
| Citation statistics | |
| Document Type | 会议论文 |
| Identifier | http://ir.ioe.ac.cn/handle/181551/7691 |
| Collection | 光电探测与信号处理研究室（五室） |
| Corresponding Author | Wang, J. |
| Affiliation | 1. Institute of Optics and Electronics, Chinese Academy of Engineering, Chengdu 610209, China 2. University of Electronic Science and Technology of China, School of Optoelectronic Information, Chengdu 610054, China |
| Recommended Citation GB/T 7714 | Wang, Jin,Wang, J.. Improved color interpolation method based on bayer image[C],2012:84200Z. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 2012-2122.pdf（561KB） | 会议论文 | 开放获取 | CC BY-NC-SA | Application Full Text | ||
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