Modeling Fizeau interferometer based on ray tracing with Zemax | |
He, Yiwei1,2; Hou, Xi1; Wu, Yongqian1; Wu, Fan1; Quan, Haiyang1; Liu, Fengwei1 | |
Volume | 9677 |
Pages | 96771G |
2015 | |
Language | 英语 |
ISSN | 0277-786X |
DOI | 10.1117/12.2197612 |
Indexed By | SCI ; Ei |
Subtype | 会议论文 |
Abstract | A convenient method to study the influence of error sources in Fizeau is to build a ray-tracing model to simulate the error sources. In this paper an interferometer model is presented; an extension program is called to simulate the interference; and a preliminary research of several error sources is conducted. These examples demonstrate error analysis based on interferometer models is feasible and provide some guidance for optimizing our interferometer design. © 2015 SPIE.; A convenient method to study the influence of error sources in Fizeau is to build a ray-tracing model to simulate the error sources. In this paper an interferometer model is presented; an extension program is called to simulate the interference; and a preliminary research of several error sources is conducted. These examples demonstrate error analysis based on interferometer models is feasible and provide some guidance for optimizing our interferometer design. © 2015 SPIE. |
Conference Name | Proceedings of SPIE - The International Society for Optical Engineering |
Conference Date | 2015 |
Citation statistics | |
Document Type | 会议论文 |
Identifier | http://ir.ioe.ac.cn/handle/181551/7627 |
Collection | 先光中心 |
Corresponding Author | He, Yiwei |
Affiliation | 1. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan, China 2. University of Chinese Academy of Sciences, Beijing, China |
Recommended Citation GB/T 7714 | He, Yiwei,Hou, Xi,Wu, Yongqian,et al. Modeling Fizeau interferometer based on ray tracing with Zemax[C],2015:96771G. |
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2015-2173.pdf(510KB) | 会议论文 | 开放获取 | CC BY-NC-SA | Application Full Text |
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