| 题名: | Removal of surface figure deformation due to gravity in optical test |
| 作者: | Gu, Wei1,2,3; Wu, Fan1; Liu, Yong2; Hou, Xi1
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| 出版日期: | 2014
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| 会议名称: | Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
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| 会议日期: | 2014
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| 学科分类: | Deformation - Manufacture - Optical data processing - Optical testing - Surface measurement
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| DOI: | 10.1117/12.2069597
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| 中文摘要: | For optical surface measurement with higher accuracy, a simple method for removing surface figure deformation due to gravity was adopted and its principle research and error analysis were conducted. Based on optical flat supporting case, properties of gravitational deformation of the tested sample was analyzed by finite element method (FEM). In order to verify high accuracy of FEM analysis, a method which could remove the original surface deviation of the reference and the tested from the test results was adopted. According to the method, difference between theoretical and experimental results represented by Root-Mean-Square (RMS) value was only 0.404 nm. The result shown that the FEM analysis is accurate enough and the surface figure deformation due to gravity could be removed from test results efficiently. The method discussed here could benefit the high accuracy optical measurement. © 2014 SPIE. |
| 英文摘要: | For optical surface measurement with higher accuracy, a simple method for removing surface figure deformation due to gravity was adopted and its principle research and error analysis were conducted. Based on optical flat supporting case, properties of gravitational deformation of the tested sample was analyzed by finite element method (FEM). In order to verify high accuracy of FEM analysis, a method which could remove the original surface deviation of the reference and the tested from the test results was adopted. According to the method, difference between theoretical and experimental results represented by Root-Mean-Square (RMS) value was only 0.404 nm. The result shown that the FEM analysis is accurate enough and the surface figure deformation due to gravity could be removed from test results efficiently. The method discussed here could benefit the high accuracy optical measurement. © 2014 SPIE. |
| 收录类别: | Ei
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| 语种: | 英语
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| 卷号: | 9282
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| ISSN号: | 0277786X
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| 文章类型: | 会议论文
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| 页码: | 928209
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| Citation statistics: |
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| 内容类型: | 会议论文
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| URI标识: | http://ir.ioe.ac.cn/handle/181551/7620
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| Appears in Collections: | 先光中心_会议论文
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作者单位: | 1. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China
2. School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu, China
3. University of Chinese Academy of Sciences, Beijing, China
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| Recommended Citation: | |
Gu, Wei,Wu, Fan,Liu, Yong,et al. Removal of surface figure deformation due to gravity in optical test[C]. 见:Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. 2014.
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