IOE OpenIR  > 光电技术研究所博硕士论文
Thesis Advisor张雨东
Degree Grantor中国科学院光电技术研究所
Place of Conferral中国科学院光电技术研究所
KeywordCcd相机 响应度 双缝夫琅和费衍射 仿真
Other AbstractCCD is abbreviation of Charge Couple Device, which is invented by Bell Laboratory in 1970's. In the past 30 years it has had a wonderful development and its application has spread all through scientific research, national defense and medical treatment. CCD has been a synthesis of optics, electronics, fine mechanics and computer. If CCD (Charge Couple Device) as a of part of a measurement system is used to measure the gain distribution of the density of light, it is necessary to measure its responsivity. There is a new method——diffraction by a double slit. CCD is widely used now. First, the working principles, also the classfications and performance parameteres of CCD, are presented in this paper. And the basic knowledge for measuring is introduced. After comparing and analysing some measuring methodes, this paper decide to use the diffraction by a double slit to measure CCD. According the results through prophase experiments, the responsivity is suppose to be known. And by simulating the experimental process of diffraction by a double slit, the validity of this measuring method is proofed. The simulation includes two parts: (1) linear response; (2) nonlinear response. Different processing methods are compared. The experiment to measure CCD is designed, and the selected processing method is used in processing experiment data. Comparing the RMS and Relative Error, there is a same tendency between the results of this experiment and prophase experiment.
Document Type学位论文
Recommended Citation
GB/T 7714
王淑青. 用于光强增益分布测量的科学CCD相机的响应度的标定方法研究[D]. 中国科学院光电技术研究所. 中国科学院光电技术研究所,2001.
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