| 题名: | Comparative analysis of three-position measurement technology and multi-positions average measurement technology |
| 作者: | Yang, Peng1,2; Wu, Fan1; Hou, Xi1
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| 出版日期: | 2012
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| 会议名称: | Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
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| 会议日期: | 2012
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| DOI: | 10.1117/12.976809
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| 通讯作者: | Yang, P.
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| 中文摘要: | Absolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error. © 2012 SPIE. |
| 英文摘要: | Absolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error. © 2012 SPIE. |
| 收录类别: | Ei
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| 语种: | 英语
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| 卷号: | 8416
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| ISSN号: | 0277786X
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| 文章类型: | 会议论文
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| 页码: | 84162C
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| Citation statistics: |
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| 内容类型: | 会议论文
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| URI标识: | http://ir.ioe.ac.cn/handle/181551/7582
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| Appears in Collections: | 先光中心_会议论文
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作者单位: | 1. Guiyang University, Guiyang 550001, China
2. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
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| Recommended Citation: | |
Yang, Peng,Wu, Fan,Hou, Xi. Comparative analysis of three-position measurement technology and multi-positions average measurement technology[C]. 见:Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. 2012.
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