| Comparative analysis of three-position measurement technology and multi-positions average measurement technology | |
| Yang, Peng1,2; Wu, Fan1; Hou, Xi1; Yang, P. | |
| Volume | 8416 |
| Pages | 84162C |
| 2012 | |
| Language | 英语 |
| ISSN | 0277786X |
| DOI | 10.1117/12.976809 |
| Indexed By | Ei |
| Subtype | 会议论文 |
| Abstract | Absolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error. © 2012 SPIE.; Absolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error. © 2012 SPIE. |
| Conference Name | Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies |
| Conference Date | 2012 |
| Citation statistics | |
| Document Type | 会议论文 |
| Identifier | http://ir.ioe.ac.cn/handle/181551/7582 |
| Collection | 先光中心 |
| Corresponding Author | Yang, P. |
| Affiliation | 1. Guiyang University, Guiyang 550001, China 2. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China |
| Recommended Citation GB/T 7714 | Yang, Peng,Wu, Fan,Hou, Xi,et al. Comparative analysis of three-position measurement technology and multi-positions average measurement technology[C],2012:84162C. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 2012-2079.pdf（3709KB） | 会议论文 | 开放获取 | CC BY-NC-SA | Application Full Text | ||
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment