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题名:
Comparative analysis of three-position measurement technology and multi-positions average measurement technology
作者: Yang, Peng1,2; Wu, Fan1; Hou, Xi1
出版日期: 2012
会议名称: Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
会议日期: 2012
DOI: 10.1117/12.976809
通讯作者: Yang, P.
中文摘要: Absolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error. © 2012 SPIE.
英文摘要: Absolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error. © 2012 SPIE.
收录类别: Ei
语种: 英语
卷号: 8416
ISSN号: 0277786X
文章类型: 会议论文
页码: 84162C
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7582
Appears in Collections:先光中心_会议论文

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作者单位: 1. Guiyang University, Guiyang 550001, China
2. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China

Recommended Citation:
Yang, Peng,Wu, Fan,Hou, Xi. Comparative analysis of three-position measurement technology and multi-positions average measurement technology[C]. 见:Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. 2012.
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