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Comparative analysis of three-position measurement technology and multi-positions average measurement technology
Yang, Peng1,2; Wu, Fan1; Hou, Xi1; Yang, P.
Volume8416
Pages84162C
2012
Language英语
ISSN0277786X
DOI10.1117/12.976809
Indexed ByEi
Subtype会议论文
AbstractAbsolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error. © 2012 SPIE.; Absolute measurement technique can separate the system error from the test results, so it's widely applied in the field of high-precision surface testing. For the testing process of three-position measurement technology is simple; it's often used for the measurement of spherical components. But three-position measurement technology is sensitive to the adjustment error. Therefore the multi-location average technology was proposed, which can reduce the influence of the adjustment error. A spherical component which diameter is 80mm and F number is 1.1 was used to test by the two technologies. Test results showed that: multi-positions average measurement technology can effectively reduce the influence of the adjustment error. © 2012 SPIE.
Conference NameProceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Conference Date2012
Citation statistics
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7582
Collection先光中心
Corresponding AuthorYang, P.
Affiliation1. Guiyang University, Guiyang 550001, China
2. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
Recommended Citation
GB/T 7714
Yang, Peng,Wu, Fan,Hou, Xi,et al. Comparative analysis of three-position measurement technology and multi-positions average measurement technology[C],2012:84162C.
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