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Analysis on the system error cause by lateral departure of the light source during Ronchi test
Bai-ping Lei; Fan Wu
Volume7656
Pages76563H (5 pp.)
2010
Language英语
Indexed ByEi ; ISTP
Subtype会议论文
AbstractThe Ronchi test is very useful for the testing of large aperture astronomical optical element, and will be more useful with the achievement of testing in a quantitative way. While when it comes to application, the light source should has a certain extent lateral departure away from the optical axis so that the image of it is apart away form itself and can be captured. This lateral departure produces the system error in the measurement. By means of optical design software, this paper studies the system error of the Ronchi test produced by the lateral departure of light source on the base of the simulation and the calculation of error according to the different distances from the optical axis, and discusses the conditions satisfied with a certain measurement requires on the foundation of the outcome. Then a system device including the light source that can be used in the practice of the measurement is designed. This device also is very useful for the other testing methods that need a high power and large relative diameter light source.; The Ronchi test is very useful for the testing of large aperture astronomical optical element, and will be more useful with the achievement of testing in a quantitative way. While when it comes to application, the light source should has a certain extent lateral departure away from the optical axis so that the image of it is apart away form itself and can be captured. This lateral departure produces the system error in the measurement. By means of optical design software, this paper studies the system error of the Ronchi test produced by the lateral departure of light source on the base of the simulation and the calculation of error according to the different distances from the optical axis, and discusses the conditions satisfied with a certain measurement requires on the foundation of the outcome. Then a system device including the light source that can be used in the practice of the measurement is designed. This device also is very useful for the other testing methods that need a high power and large relative diameter light source.
Conference NameProceedings of the SPIE - The International Society for Optical Engineering
Conference Date2010
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7561
Collection先光中心
Corresponding AuthorBai-ping Lei
Affiliation中国科学院光电技术研究所
Recommended Citation
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Bai-ping Lei,Fan Wu. Analysis on the system error cause by lateral departure of the light source during Ronchi test[C],2010:76563H (5 pp.).
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