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题名:
Analysis on the system error cause by lateral departure of the light source during Ronchi test
作者: Bai-ping Lei; Fan Wu
出版日期: 2010
会议名称: Proceedings of the SPIE - The International Society for Optical Engineering
会议日期: 2010
通讯作者: Bai-ping Lei
中文摘要: The Ronchi test is very useful for the testing of large aperture astronomical optical element, and will be more useful with the achievement of testing in a quantitative way. While when it comes to application, the light source should has a certain extent lateral departure away from the optical axis so that the image of it is apart away form itself and can be captured. This lateral departure produces the system error in the measurement. By means of optical design software, this paper studies the system error of the Ronchi test produced by the lateral departure of light source on the base of the simulation and the calculation of error according to the different distances from the optical axis, and discusses the conditions satisfied with a certain measurement requires on the foundation of the outcome. Then a system device including the light source that can be used in the practice of the measurement is designed. This device also is very useful for the other testing methods that need a high power and large relative diameter light source.
英文摘要: The Ronchi test is very useful for the testing of large aperture astronomical optical element, and will be more useful with the achievement of testing in a quantitative way. While when it comes to application, the light source should has a certain extent lateral departure away from the optical axis so that the image of it is apart away form itself and can be captured. This lateral departure produces the system error in the measurement. By means of optical design software, this paper studies the system error of the Ronchi test produced by the lateral departure of light source on the base of the simulation and the calculation of error according to the different distances from the optical axis, and discusses the conditions satisfied with a certain measurement requires on the foundation of the outcome. Then a system device including the light source that can be used in the practice of the measurement is designed. This device also is very useful for the other testing methods that need a high power and large relative diameter light source.
收录类别: Ei ; ISTP
语种: 英语
卷号: 7656
文章类型: 会议论文
页码: 76563H (5 pp.)
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7561
Appears in Collections:先光中心_会议论文

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作者单位: 中国科学院光电技术研究所

Recommended Citation:
Bai-ping Lei,Fan Wu. Analysis on the system error cause by lateral departure of the light source during Ronchi test[C]. 见:Proceedings of the SPIE - The International Society for Optical Engineering. 2010.
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文件名: 2010-135.pdf
格式: Adobe PDF
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