IOE OpenIR  > 光电测控技术研究室(三室)
Design of embedded performance testing and fault diagnosing platform
Leng, Xiao1,2; Su, Hai-Bing1,2; Zhang, Gang1,2; Leng, X. (131001737@163.com)
Pages343-346
2012
Language英语
DOI10.1109/ICICEE.2012.97
Indexed ByEi
Subtype会议论文
AbstractOnce who has developed a complete high-performance embedded digital signal parallel processing platform, its performance testing and fault diagnosising is a task must be completed. For an advanced embedded parallel processing platform, we have built a performance test and fault diagnosis platform, the main interface of the client program send the test command to the server side by the network interface program, the server-side download the DSP or FPGA program to the board through the PCI-E driver program, and then read the test results, send the results back to the main interface program to complete the testing process. Performance test used to ensure the performance of the system running to meet user's demand, play an important role in quality assurance. Fault diagnosis is also required during the development stage. © 2012 IEEE.; Once who has developed a complete high-performance embedded digital signal parallel processing platform, its performance testing and fault diagnosising is a task must be completed. For an advanced embedded parallel processing platform, we have built a performance test and fault diagnosis platform, the main interface of the client program send the test command to the server side by the network interface program, the server-side download the DSP or FPGA program to the board through the PCI-E driver program, and then read the test results, send the results back to the main interface program to complete the testing process. Performance test used to ensure the performance of the system running to meet user's demand, play an important role in quality assurance. Fault diagnosis is also required during the development stage. © 2012 IEEE.
Conference NameProceedings of the 2012 International Conference on Industrial Control and Electronics Engineering, ICICEE 2012
Conference Date2012
Citation statistics
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7544
Collection光电测控技术研究室(三室)
Corresponding AuthorLeng, X. (131001737@163.com)
Affiliation1. Institute of Optics and Electronics, Chinese Academic of Sciences, Chengdu, Sichuan, China
2. Graduate University, Chinese Academy of Sciences, Beijing, China
Recommended Citation
GB/T 7714
Leng, Xiao,Su, Hai-Bing,Zhang, Gang,et al. Design of embedded performance testing and fault diagnosing platform[C],2012:343-346.
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