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题名:
Design of embedded performance testing and fault diagnosing platform
作者: Leng, Xiao1,2; Su, Hai-Bing1,2; Zhang, Gang1,2
出版日期: 2012
会议名称: Proceedings of the 2012 International Conference on Industrial Control and Electronics Engineering, ICICEE 2012
会议日期: 2012
DOI: 10.1109/ICICEE.2012.97
通讯作者: Leng, X. (131001737@163.com)
中文摘要: Once who has developed a complete high-performance embedded digital signal parallel processing platform, its performance testing and fault diagnosising is a task must be completed. For an advanced embedded parallel processing platform, we have built a performance test and fault diagnosis platform, the main interface of the client program send the test command to the server side by the network interface program, the server-side download the DSP or FPGA program to the board through the PCI-E driver program, and then read the test results, send the results back to the main interface program to complete the testing process. Performance test used to ensure the performance of the system running to meet user's demand, play an important role in quality assurance. Fault diagnosis is also required during the development stage. © 2012 IEEE.
英文摘要: Once who has developed a complete high-performance embedded digital signal parallel processing platform, its performance testing and fault diagnosising is a task must be completed. For an advanced embedded parallel processing platform, we have built a performance test and fault diagnosis platform, the main interface of the client program send the test command to the server side by the network interface program, the server-side download the DSP or FPGA program to the board through the PCI-E driver program, and then read the test results, send the results back to the main interface program to complete the testing process. Performance test used to ensure the performance of the system running to meet user's demand, play an important role in quality assurance. Fault diagnosis is also required during the development stage. © 2012 IEEE.
收录类别: Ei
语种: 英语
文章类型: 会议论文
页码: 343-346
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7544
Appears in Collections:光电探测技术研究室(三室)_会议论文

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作者单位: 1. Institute of Optics and Electronics, Chinese Academic of Sciences, Chengdu, Sichuan, China
2. Graduate University, Chinese Academy of Sciences, Beijing, China

Recommended Citation:
Leng, Xiao,Su, Hai-Bing,Zhang, Gang. Design of embedded performance testing and fault diagnosing platform[C]. 见:Proceedings of the 2012 International Conference on Industrial Control and Electronics Engineering, ICICEE 2012. 2012.
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