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Assess Image Blur in Photoelectric Imaging System
Xiaofu Xie; Jin Zhou; Qinzhang Wu
Volume7658
Pages765803 (6 pp.)
2010
Language英语
Indexed ByEi ; ISTP
Subtype会议论文
AbstractThe difficulty for no-reference image quality assessment is the lack of the information of the reference image. With the analysis of the mathematical model of the photoelectric imaging system and the reason for image blur, a method is proposed for constructing reference images, and at the same time the Structural Similarity index is introduced into no-reference image quality assessment. A novel no-reference image quality assessment index called No-Reference Structural Sharpness is then proposed for quality evaluation of blurred images. This method constructs a reference image by a low-pass filter, and assesses the image quality by computing the structural similarity index between the original image and the reference one, thus considering the mathematical model of imaging system as well as the advantages of Structural Similarity index. The experimental results show that the new index is well in accordance with quality assessment results of both subjective evaluation and full-reference methods.; The difficulty for no-reference image quality assessment is the lack of the information of the reference image. With the analysis of the mathematical model of the photoelectric imaging system and the reason for image blur, a method is proposed for constructing reference images, and at the same time the Structural Similarity index is introduced into no-reference image quality assessment. A novel no-reference image quality assessment index called No-Reference Structural Sharpness is then proposed for quality evaluation of blurred images. This method constructs a reference image by a low-pass filter, and assesses the image quality by computing the structural similarity index between the original image and the reference one, thus considering the mathematical model of imaging system as well as the advantages of Structural Similarity index. The experimental results show that the new index is well in accordance with quality assessment results of both subjective evaluation and full-reference methods.
Conference NameProceedings of the SPIE - The International Society for Optical Engineering
Conference Date2010
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7523
Collection光电测控技术研究室(三室)
Corresponding AuthorXiaofu Xie
Affiliation中国科学院光电技术研究所
Recommended Citation
GB/T 7714
Xiaofu Xie,Jin Zhou,Qinzhang Wu. Assess Image Blur in Photoelectric Imaging System[C],2010:765803 (6 pp.).
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