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题名:
Discussion on a method of target's infrared feature extraction
作者: Tian, Wenxing1,2; Li, Qiang1; Fu, Jingneng1; Cui, Lanfang1,2
出版日期: 2014
会议名称: Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
会议日期: 2014
学科分类: Feature extraction - Manufacture - Optical testing - Optimization
DOI: 10.1117/12.2069847
通讯作者: Tian, Wenxing
中文摘要: Infrared characteristics of the target show some surface features of targets. By analyzing the infrared characteristics of the targets, specific properties and working condition of targets can be obtained. By studying the methods of the infrared properties of the targets, we can get a method of extracting the target surface characteristics. Actual spectral irradiance is calculated according to the dimension reduction and target's infrared signal. Optimization model can be obtained by matching the theoretical formula of target's irradiance with actual spectral irradiance. Equivalent temperature and equivalent area of target can be calculated by optimization methods. © 2014 SPIE.
英文摘要: Infrared characteristics of the target show some surface features of targets. By analyzing the infrared characteristics of the targets, specific properties and working condition of targets can be obtained. By studying the methods of the infrared properties of the targets, we can get a method of extracting the target surface characteristics. Actual spectral irradiance is calculated according to the dimension reduction and target's infrared signal. Optimization model can be obtained by matching the theoretical formula of target's irradiance with actual spectral irradiance. Equivalent temperature and equivalent area of target can be calculated by optimization methods. © 2014 SPIE.
收录类别: Ei
语种: 英语
卷号: 9282
ISSN号: 0277786X
文章类型: 会议论文
页码: 92823A
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7492
Appears in Collections:应用光学研究室(二室)_会议论文

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作者单位: 1. Lab of Applied Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China
2. University of Chinese Academy of Sciences, Beijing, China

Recommended Citation:
Tian, Wenxing,Li, Qiang,Fu, Jingneng,et al. Discussion on a method of target's infrared feature extraction[C]. 见:Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. 2014.
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