IOE OpenIR  > 应用光学研究室(二室)
Design of twin computer-generated hologram for absolute testing of aspheric surfaces
Feng, Jie1,2; Deng, Chao1; Xing, Tingwen1
Volume9282
Pages92821M
2014
Language英语
ISSN0277786X
DOI10.1117/12.2068507
Indexed ByEi
Subtype会议论文
AbstractTesting of aspheric surfaces by means of computer-generated holograms(CGHs)is well known. To perform an absolute test of rotationally symmetric aspheric surfaces, a specially designed computer-generated hologram (CGH) that reconstructs an aspherical wave as well as a spherical auxiliary wave. Since both phase functions have the same symmetry and their pattern is simultaneously encoded, we call this type of multiplex hologram a Twin-CGH. The spherical wave is used for calibration. The design principle of Twin-CGH is introduced in this paper. We mathematically analyze the Twin-CGH constructed by taking the phase corresponding to the linear combination of two weighted phase functions. We show that this Twin-CGH may be written as a new linear combination for the original phase functions with new weights. Then we absolutely test aspheric surfaces by Twin-CGH. © 2014 SPIE.; Testing of aspheric surfaces by means of computer-generated holograms(CGHs)is well known. To perform an absolute test of rotationally symmetric aspheric surfaces, a specially designed computer-generated hologram (CGH) that reconstructs an aspherical wave as well as a spherical auxiliary wave. Since both phase functions have the same symmetry and their pattern is simultaneously encoded, we call this type of multiplex hologram a Twin-CGH. The spherical wave is used for calibration. The design principle of Twin-CGH is introduced in this paper. We mathematically analyze the Twin-CGH constructed by taking the phase corresponding to the linear combination of two weighted phase functions. We show that this Twin-CGH may be written as a new linear combination for the original phase functions with new weights. Then we absolutely test aspheric surfaces by Twin-CGH. © 2014 SPIE.
Conference NameProceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Conference Date2014
Citation statistics
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7491
Collection应用光学研究室(二室)
Corresponding AuthorFeng, Jie
Affiliation1. Laboratory of Applied Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China
2. University of Chinese Academy of Sciences, Beijing, China
Recommended Citation
GB/T 7714
Feng, Jie,Deng, Chao,Xing, Tingwen. Design of twin computer-generated hologram for absolute testing of aspheric surfaces[C],2014:92821M.
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