| 题名: | Absolute testing of freeform lens |
| 作者: | Xin, Jia; Tingwen, Xing
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| 出版日期: | 2013
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| 会议名称: | Proceedings of SPIE: Optifab 2013
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| 会议日期: | 2013
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| 学科分类: | Engineering - Measurements - Molecular physics - Optical testing
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| DOI: | 10.1117/12.2029187
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| 中文摘要: | The absolute testing method can be used to test the freeform lens. There are some spatial frequencies terms can't be getting by the traditional absolute testing method such as even and odd functions method, rotation shear method, rotated equally spaced position method. In this paper we will show the losing terms in the traditional method. In this paper the freeform surface is created by 300th Zernike polynomials. The freeform lens is based on the flat lens. We use the Zernike polynomial to simulate the two flats and use the freeform surface as the three flat. According to the three flat absolute testing methods, we can simulate the testing result. The freeform flat which we use is polishing by the ion figuring machine of NTG. © 2013 SPIE. |
| 英文摘要: | The absolute testing method can be used to test the freeform lens. There are some spatial frequencies terms can't be getting by the traditional absolute testing method such as even and odd functions method, rotation shear method, rotated equally spaced position method. In this paper we will show the losing terms in the traditional method. In this paper the freeform surface is created by 300th Zernike polynomials. The freeform lens is based on the flat lens. We use the Zernike polynomial to simulate the two flats and use the freeform surface as the three flat. According to the three flat absolute testing methods, we can simulate the testing result. The freeform flat which we use is polishing by the ion figuring machine of NTG. © 2013 SPIE. |
| 收录类别: | Ei
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| 语种: | 英语
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| 卷号: | 8884
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| ISSN号: | 0277786X
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| 文章类型: | 会议论文
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| 页码: | 888429
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| Citation statistics: |
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| 内容类型: | 会议论文
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| URI标识: | http://ir.ioe.ac.cn/handle/181551/7482
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| Appears in Collections: | 应用光学研究室（二室）_会议论文
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作者单位: | Lab of Applied Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
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| Recommended Citation: | |
Xin, Jia,Tingwen, Xing. Absolute testing of freeform lens[C]. 见:Proceedings of SPIE: Optifab 2013. 2013.
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