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题名:
Wavefront testing of pinhole based on point diffraction interferometer
作者: Jia, Xin; Xing, Tingwen; Xu, Jiajun; Lin, Wumei; Liao, Zhijie
出版日期: 2013
会议名称: Proceedings of SPIE: Optical Microlithography XXVI
会议日期: 2013
学科分类: Diffraction - Interferometers - Measurements - Optical testing
DOI: 10.1117/12.2011429
中文摘要: To overcome the accuracy limitation due to the aberration of reference wavefront in the interferometer testing, the point diffraction interferometer (PDI) uses the pinhole to create an ideal diffraction sphere wavefront as the reference wavefront. Because the perfect pinhole is hard to manufacture, then the imperfect pinhole will cause the wavefront errors which will influence the test accuracy. In this paper we use the absolute testing method to test the wave front of the pinhole. Then the testing accuracy of point diffraction interferometer can be improved by subtracting the error of the pinhole. In this paper a Phase-shifting point diffraction interferometer system is designed to testing the pinhole. We use three pinholes to test each other. According the algorithm of the absolute testing method, we can calculate the wavefront error of the pinhole. Then the testing accuracy of point diffraction interferometer can be improved by subtracting the error of the pinhole. © 2013 SPIE.
英文摘要: To overcome the accuracy limitation due to the aberration of reference wavefront in the interferometer testing, the point diffraction interferometer (PDI) uses the pinhole to create an ideal diffraction sphere wavefront as the reference wavefront. Because the perfect pinhole is hard to manufacture, then the imperfect pinhole will cause the wavefront errors which will influence the test accuracy. In this paper we use the absolute testing method to test the wave front of the pinhole. Then the testing accuracy of point diffraction interferometer can be improved by subtracting the error of the pinhole. In this paper a Phase-shifting point diffraction interferometer system is designed to testing the pinhole. We use three pinholes to test each other. According the algorithm of the absolute testing method, we can calculate the wavefront error of the pinhole. Then the testing accuracy of point diffraction interferometer can be improved by subtracting the error of the pinhole. © 2013 SPIE.
收录类别: Ei
语种: 英语
卷号: 8683
ISSN号: 0277786X
文章类型: 会议论文
页码: 86832F
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7475
Appears in Collections:应用光学研究室(二室)_会议论文

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作者单位: Lab of Applied Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China

Recommended Citation:
Jia, Xin,Xing, Tingwen,Xu, Jiajun,et al. Wavefront testing of pinhole based on point diffraction interferometer[C]. 见:Proceedings of SPIE: Optical Microlithography XXVI. 2013.
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