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题名:
error analysis of ablolute interferometric testing based on reconstruction of rotational shear
作者: Jia Xin; Xing Tingwen
出版日期: 2010
会议名称: 2010 second international conference on test and measurement
会议日期: 2010
通讯作者: Jia Xin
语种: 英语
文章类型: 会议论文
页码: 233-236
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7446
Appears in Collections:应用光学研究室(二室)_会议论文

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作者单位: 中国科学院光电技术研究所

Recommended Citation:
Jia Xin,Xing Tingwen. error analysis of ablolute interferometric testing based on reconstruction of rotational shear[C]. 见:2010 second international conference on test and measurement. 2010.
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文件名: 2010-065.pdf
格式: Adobe PDF
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