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Focusing property of high numerical aperture photon sieves based on vector diffraction
Tang, Yan; Hu, Song; Yang, Yong; He, Yu; Tang, Y. (ty0513@163.com)
Source PublicationOptics Communications
Volume295Pages:1-4
2013
Language英语
ISSN00304018
DOI10.1016/j.optcom.2012.12.016
Indexed BySCI ; Ei
WOS IDWOS:000317704500001
Subtype期刊论文
AbstractPhoton sieves (PS) vector diffraction model and focus property with polarized illumination are proposed for the first time. The existing PS theories are limited to the scale diffraction. And for its special structure, the PS vector diffraction property is different from that of traditional optical elements and hard to be calculated. In order to describe the property of the PS with high numerical aperture (NA) exactly, the optical field of PS based on vector diffraction is proposed. Based on the vector diffraction model, simulations are carried out to analyze the focus property of the high NA PS while the illumination polarizations are linear, radial, and azimuthal. It shows that the focus property of the high NA PS changes with the polarization of the illumination. Therefore, in the applications of high NA PS, the illumination polarization needs to be considered. Furthermore, to describe the property of high NA PS, the vector diffraction model must be used instead of the scalar one. The vector diffraction model and polarization property of the PS proposed in this study not only improve the existing PS theories, but can also be used in the further design and analysis of the high NA PS. © 2012 Elsevier B.V.; Photon sieves (PS) vector diffraction model and focus property with polarized illumination are proposed for the first time. The existing PS theories are limited to the scale diffraction. And for its special structure, the PS vector diffraction property is different from that of traditional optical elements and hard to be calculated. In order to describe the property of the PS with high numerical aperture (NA) exactly, the optical field of PS based on vector diffraction is proposed. Based on the vector diffraction model, simulations are carried out to analyze the focus property of the high NA PS while the illumination polarizations are linear, radial, and azimuthal. It shows that the focus property of the high NA PS changes with the polarization of the illumination. Therefore, in the applications of high NA PS, the illumination polarization needs to be considered. Furthermore, to describe the property of high NA PS, the vector diffraction model must be used instead of the scalar one. The vector diffraction model and polarization property of the PS proposed in this study not only improve the existing PS theories, but can also be used in the further design and analysis of the high NA PS. © 2012 Elsevier B.V.
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Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/7282
Collection微电子装备总体研究室(四室)
Corresponding AuthorTang, Y. (ty0513@163.com)
Affiliation State Key Laboratory of Optical Technologies for Microfabrication, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
Recommended Citation
GB/T 7714
Tang, Yan,Hu, Song,Yang, Yong,et al. Focusing property of high numerical aperture photon sieves based on vector diffraction[J]. Optics Communications,2013,295:1-4.
APA Tang, Yan,Hu, Song,Yang, Yong,He, Yu,&Tang, Y. .(2013).Focusing property of high numerical aperture photon sieves based on vector diffraction.Optics Communications,295,1-4.
MLA Tang, Yan,et al."Focusing property of high numerical aperture photon sieves based on vector diffraction".Optics Communications 295(2013):1-4.
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