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题名:
Focusing property of high numerical aperture photon sieves based on vector diffraction
作者: Tang, Yan; Hu, Song; Yang, Yong; He, Yu
刊名: Optics Communications
出版日期: 2013
卷号: 295, 页码:1-4
学科分类: Computer simulation - Optics - Polarization
DOI: 10.1016/j.optcom.2012.12.016
通讯作者: Tang, Y. (ty0513@163.com)
文章类型: 期刊论文
中文摘要: Photon sieves (PS) vector diffraction model and focus property with polarized illumination are proposed for the first time. The existing PS theories are limited to the scale diffraction. And for its special structure, the PS vector diffraction property is different from that of traditional optical elements and hard to be calculated. In order to describe the property of the PS with high numerical aperture (NA) exactly, the optical field of PS based on vector diffraction is proposed. Based on the vector diffraction model, simulations are carried out to analyze the focus property of the high NA PS while the illumination polarizations are linear, radial, and azimuthal. It shows that the focus property of the high NA PS changes with the polarization of the illumination. Therefore, in the applications of high NA PS, the illumination polarization needs to be considered. Furthermore, to describe the property of high NA PS, the vector diffraction model must be used instead of the scalar one. The vector diffraction model and polarization property of the PS proposed in this study not only improve the existing PS theories, but can also be used in the further design and analysis of the high NA PS. © 2012 Elsevier B.V.
英文摘要: Photon sieves (PS) vector diffraction model and focus property with polarized illumination are proposed for the first time. The existing PS theories are limited to the scale diffraction. And for its special structure, the PS vector diffraction property is different from that of traditional optical elements and hard to be calculated. In order to describe the property of the PS with high numerical aperture (NA) exactly, the optical field of PS based on vector diffraction is proposed. Based on the vector diffraction model, simulations are carried out to analyze the focus property of the high NA PS while the illumination polarizations are linear, radial, and azimuthal. It shows that the focus property of the high NA PS changes with the polarization of the illumination. Therefore, in the applications of high NA PS, the illumination polarization needs to be considered. Furthermore, to describe the property of high NA PS, the vector diffraction model must be used instead of the scalar one. The vector diffraction model and polarization property of the PS proposed in this study not only improve the existing PS theories, but can also be used in the further design and analysis of the high NA PS. © 2012 Elsevier B.V.
收录类别: SCI ; Ei
项目资助者: National Natural Science Foundation of China [61076099]
语种: 英语
WOS记录号: WOS:000317704500001
ISSN号: 00304018
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/7282
Appears in Collections:微电子装备总体研究室(四室)_期刊论文

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作者单位: State Key Laboratory of Optical Technologies for Microfabrication, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China

Recommended Citation:
Tang, Yan,Hu, Song,Yang, Yong,et al. Focusing property of high numerical aperture photon sieves based on vector diffraction[J]. Optics Communications,2013,295:1-4.
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