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题名:
Sharp Fano resonance induced by a single layer of nanorods with perturbed periodicity
作者: Song, Maowen1,2,3; Yu, Honglin1; Wang, Changtao2; Yao, Na2; Pu, Mingbo2; Luo, Jun1,2,3; Zhang, Zuojun1,2,3; Luo, Xiangang2
刊名: Optics Express
出版日期: 2015
卷号: 23, 期号:3, 页码:2895-2903
学科分类: Fabry-Perot interferometers - Nanorods - Resonance
DOI: 10.1364/OE.23.002895
文章类型: 期刊论文
中文摘要: In this paper, we report the formation of extremely sharp (Quality factor Q∼ + ∞) FR in a single layer of dielectric nanorods with perturbed periodicity. The interference between the broadband Fabry-Perot (F-P) resonance and defect induced dark mode results in refractive index sensitivity (S) of 1312.75 nm/RIU and figure of merit (FOM) of 500, offering an excellent platform for biological sensing and detection. © 2015 Optical Society of America.
英文摘要: In this paper, we report the formation of extremely sharp (Quality factor Q∼ + ∞) FR in a single layer of dielectric nanorods with perturbed periodicity. The interference between the broadband Fabry-Perot (F-P) resonance and defect induced dark mode results in refractive index sensitivity (S) of 1312.75 nm/RIU and figure of merit (FOM) of 500, offering an excellent platform for biological sensing and detection. © 2015 Optical Society of America.
收录类别: SCI ; Ei
项目资助者: 973 Program of China [2013CBA01700] ; National Natural Science Funds [61138002]
语种: 英语
WOS记录号: WOS:000349688800109
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/6905
Appears in Collections:微细加工光学技术国家重点实验室(开放室)_期刊论文

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作者单位: 1. Key Lab. of Optoelectronic Technology and Systems, Education Ministry of China, Chongqing University, Chongqing, China
2. State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Science, P.O. Box 350, Chengdu, China
3. University of Chinese Academy of Sciences, Beijing, China

Recommended Citation:
Song, Maowen,Yu, Honglin,Wang, Changtao,et al. Sharp Fano resonance induced by a single layer of nanorods with perturbed periodicity[J]. Optics Express,2015,23(3):2895-2903.
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