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Numerical study on optical properties of Ag/SiO2SiO 2/Ag sandwich nanocrescents substrate
Luo, Ji; Zhuang, Xuye; Xiong, Wei; Yao, Jun; Yao, J. (junyao@ioe.ac.cn)
Source PublicationJournal of Modern Optics
Volume59Issue:15Pages:1316-1321
2012
Language英语
ISSN09500340
DOI10.1080/09500340.2012.713129
Indexed ByEi
WOS IDWOS:000309116800004
Subtype期刊论文
AbstractA novel structure of a metal/dielectric/metal (Ag/SiO2SiO 2/Ag) sandwich nanocrescent has been proposed and studied. We make a detailed numerical analysis on the extinction efficiency and LSPR property of the sandwich nanocrescent by using the finite difference time domain (FDTD) method. It clearly demonstrates that a comparable field enhancement can be achieved by varying the thickness of the SiO2SiO2 layer at different incident polarizations. Excited in the Y-polarization, the maximum electric field enhancement factor reaches 600 at the peak wavelength 1108.9nm, which is six times higher than previous reported single layer nanocrescent. The refractive index sensitivity of this new sandwich nanocrescent is 375.5nm/RIU (refractive index unit). The structure is shown to produce a high local field enhancement as well as wide plasmon resonance tunabilities. Besides, compared with adjusting the shape and size of the single layer nanocrescent structure, it is much more convenient and easier to change the thickness of the sandwich nanocrescent. Due to its excellent properties, this structure is very suitable for LSPR and SERS nanosensing substrate. © 2012 Copyright Taylor and Francis Group, LLC.; A novel structure of a metal/dielectric/metal (Ag/SiO2SiO 2/Ag) sandwich nanocrescent has been proposed and studied. We make a detailed numerical analysis on the extinction efficiency and LSPR property of the sandwich nanocrescent by using the finite difference time domain (FDTD) method. It clearly demonstrates that a comparable field enhancement can be achieved by varying the thickness of the SiO2SiO2 layer at different incident polarizations. Excited in the Y-polarization, the maximum electric field enhancement factor reaches 600 at the peak wavelength 1108.9nm, which is six times higher than previous reported single layer nanocrescent. The refractive index sensitivity of this new sandwich nanocrescent is 375.5nm/RIU (refractive index unit). The structure is shown to produce a high local field enhancement as well as wide plasmon resonance tunabilities. Besides, compared with adjusting the shape and size of the single layer nanocrescent structure, it is much more convenient and easier to change the thickness of the sandwich nanocrescent. Due to its excellent properties, this structure is very suitable for LSPR and SERS nanosensing substrate. © 2012 Copyright Taylor and Francis Group, LLC.
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Cited Times:3[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/6794
Collection微细加工光学技术国家重点实验室(开放室)
Corresponding AuthorYao, J. (junyao@ioe.ac.cn)
Affiliation State Key Lab of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
Recommended Citation
GB/T 7714
Luo, Ji,Zhuang, Xuye,Xiong, Wei,et al. Numerical study on optical properties of Ag/SiO2SiO 2/Ag sandwich nanocrescents substrate[J]. Journal of Modern Optics,2012,59(15):1316-1321.
APA Luo, Ji,Zhuang, Xuye,Xiong, Wei,Yao, Jun,&Yao, J. .(2012).Numerical study on optical properties of Ag/SiO2SiO 2/Ag sandwich nanocrescents substrate.Journal of Modern Optics,59(15),1316-1321.
MLA Luo, Ji,et al."Numerical study on optical properties of Ag/SiO2SiO 2/Ag sandwich nanocrescents substrate".Journal of Modern Optics 59.15(2012):1316-1321.
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