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题名:
Numerical study on optical properties of Ag/SiO2SiO 2/Ag sandwich nanocrescents substrate
作者: Luo, Ji; Zhuang, Xuye; Xiong, Wei; Yao, Jun
刊名: Journal of Modern Optics
出版日期: 2012
卷号: 59, 期号:15, 页码:1316-1321
学科分类: Electric fields - Finite difference time domain method - Numerical analysis - Polarization - Refractive index - Surface plasmon resonance - Time domain analysis
DOI: 10.1080/09500340.2012.713129
通讯作者: Yao, J. (junyao@ioe.ac.cn)
文章类型: 期刊论文
中文摘要: A novel structure of a metal/dielectric/metal (Ag/SiO2SiO 2/Ag) sandwich nanocrescent has been proposed and studied. We make a detailed numerical analysis on the extinction efficiency and LSPR property of the sandwich nanocrescent by using the finite difference time domain (FDTD) method. It clearly demonstrates that a comparable field enhancement can be achieved by varying the thickness of the SiO2SiO2 layer at different incident polarizations. Excited in the Y-polarization, the maximum electric field enhancement factor reaches 600 at the peak wavelength 1108.9nm, which is six times higher than previous reported single layer nanocrescent. The refractive index sensitivity of this new sandwich nanocrescent is 375.5nm/RIU (refractive index unit). The structure is shown to produce a high local field enhancement as well as wide plasmon resonance tunabilities. Besides, compared with adjusting the shape and size of the single layer nanocrescent structure, it is much more convenient and easier to change the thickness of the sandwich nanocrescent. Due to its excellent properties, this structure is very suitable for LSPR and SERS nanosensing substrate. © 2012 Copyright Taylor and Francis Group, LLC.
英文摘要: A novel structure of a metal/dielectric/metal (Ag/SiO2SiO 2/Ag) sandwich nanocrescent has been proposed and studied. We make a detailed numerical analysis on the extinction efficiency and LSPR property of the sandwich nanocrescent by using the finite difference time domain (FDTD) method. It clearly demonstrates that a comparable field enhancement can be achieved by varying the thickness of the SiO2SiO2 layer at different incident polarizations. Excited in the Y-polarization, the maximum electric field enhancement factor reaches 600 at the peak wavelength 1108.9nm, which is six times higher than previous reported single layer nanocrescent. The refractive index sensitivity of this new sandwich nanocrescent is 375.5nm/RIU (refractive index unit). The structure is shown to produce a high local field enhancement as well as wide plasmon resonance tunabilities. Besides, compared with adjusting the shape and size of the single layer nanocrescent structure, it is much more convenient and easier to change the thickness of the sandwich nanocrescent. Due to its excellent properties, this structure is very suitable for LSPR and SERS nanosensing substrate. © 2012 Copyright Taylor and Francis Group, LLC.
收录类别: Ei
语种: 英语
WOS记录号: WOS:000309116800004
ISSN号: 09500340
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/6794
Appears in Collections:微细加工光学技术国家重点实验室(开放室)_期刊论文

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作者单位: State Key Lab of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China

Recommended Citation:
Luo, Ji,Zhuang, Xuye,Xiong, Wei,et al. Numerical study on optical properties of Ag/SiO2SiO 2/Ag sandwich nanocrescents substrate[J]. Journal of Modern Optics,2012,59(15):1316-1321.
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