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题名:
Study on the measurement sensitivity for optical coatings absorption loss by the photothermal detuning technique
作者: Hao, Honggang1; Rao, Min1; Zhou, Ao1; Yin, Bo1; Li, Bincheng2
刊名: Optik
出版日期: 2013
卷号: 124, 期号:3, 页码:250-254
学科分类: Absorption - Coatings - Probes - Reflective coatings
DOI: 10.1016/j.ijleo.2011.11.075
通讯作者: Hao, H. (haohg@cqupt.edu.cn)
文章类型: 期刊论文
中文摘要: The photothermal detuning technique (PTDT) is a novel photothermal technique and can be used to measure the absorption of the optical coatings, which utilizes the spectral shift of optical coatings caused by absorption-induced temperature rise. The measurement sensitivity depends on the slope of the spectrum band edge and the character of the probe beam, and is limited by the temperature coefficient of the reflectivity or transmission. Based on the preliminary study, the impact of the spectrum band slope and the probe beam character on the measurement sensitivity are detailed studied. Experiments are performed with a highly reflective coating. The results show that the measurement sensitivity is determined by the structure and the optical-thermal parameters. Appropriate wavelength, incident angle and polarization properties of the probe beam can improve the measurement sensitivity. The results provide a theoretical and experimental basis for the application of the photothermal detuning technique for absorption loss of the thin film. © 2011 Elsevier GmbH.
英文摘要: The photothermal detuning technique (PTDT) is a novel photothermal technique and can be used to measure the absorption of the optical coatings, which utilizes the spectral shift of optical coatings caused by absorption-induced temperature rise. The measurement sensitivity depends on the slope of the spectrum band edge and the character of the probe beam, and is limited by the temperature coefficient of the reflectivity or transmission. Based on the preliminary study, the impact of the spectrum band slope and the probe beam character on the measurement sensitivity are detailed studied. Experiments are performed with a highly reflective coating. The results show that the measurement sensitivity is determined by the structure and the optical-thermal parameters. Appropriate wavelength, incident angle and polarization properties of the probe beam can improve the measurement sensitivity. The results provide a theoretical and experimental basis for the application of the photothermal detuning technique for absorption loss of the thin film. © 2011 Elsevier GmbH.
收录类别: SCI ; Ei
项目资助者: Natural Science Foundation of China [60907041] ; Natural Science Foundation of Chongqing University of Posts and Telecommunications [A2009-05]
语种: 英语
WOS记录号: WOS:000315312800015
ISSN号: 00304026
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/6629
Appears in Collections:薄膜光学技术研究室(十一室)_期刊论文

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作者单位: 1. College of Electronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 400065, China
2. Institute of Optics and Electronics, Chinese Academy of Sciences, P.O. Box 350, Shuangliu, Chengdu, Sichuan 610209, China

Recommended Citation:
Hao, Honggang,Rao, Min,Zhou, Ao,et al. Study on the measurement sensitivity for optical coatings absorption loss by the photothermal detuning technique[J]. Optik,2013,124(3):250-254.
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